Measurement Technique for the Static Output Characterization of High-Current Power MOSFETs

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2007.900146 ◽

2007 ◽

Vol 56 (4) ◽

pp. 1347-1354 ◽

Author(s):

Toni Lopez ◽

Reinhold Elferich

Keyword(s):

Measurement Technique ◽

High Current ◽

Power Mosfets ◽

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Measurement Technique for the Static Output Characterisation of High Current Power MOSFETs

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings ◽

10.1109/imtc.2006.235834 ◽

2006 ◽

Author(s):

Toni Lopez

Keyword(s):

Measurement Technique ◽

High Current ◽

Power Mosfets ◽

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Measurement Technique for the Static Output Characterisation of High Current Power MOSFETs

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings ◽

10.1109/imtc.2006.328285 ◽

2006 ◽

Author(s):

Toni Lopez ◽

Reinhold Elferich

Keyword(s):

Measurement Technique ◽

High Current ◽

Power Mosfets ◽

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Dynamic characterization of the input and reverse transfer capacitances in power MOSFETs under high current conduction

2016 IEEE Applied Power Electronics Conference and Exposition (APEC) ◽

10.1109/apec.2016.7468285 ◽

2016 ◽

Author(s):

Cristino Salcines ◽

Ingmar Kallfass ◽

Hisao Kakitani ◽

Atsushi Mikata

Keyword(s):

High Current ◽

Dynamic Characterization ◽

Reverse Transfer ◽

Power Mosfets ◽

Current Conduction

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Nanotechnologies. Measurement technique matrix for the characterization of nano-objects

10.3403/30280225u ◽

2017 ◽

Keyword(s):

Measurement Technique

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Static and dynamic characterization of large-area high-current-density SiC Schottky diodes

56th Annual Device Research Conference Digest (Cat. No.98TH8373) ◽

10.1109/drc.1998.731131 ◽

2002 ◽

Author(s):

G.M. Dolny ◽

D.T. Morisette ◽

P.M. Shenoy ◽

M. Zafrani ◽

J. Gladish ◽

...

Keyword(s):

Current Density ◽

High Current Density ◽

Schottky Diodes ◽

High Current ◽

Dynamic Characterization ◽

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Single Shot Avalanche Characterization of Series and Parallel Connection of SiC Power MOSFETs

2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) ◽

10.1109/wipda46397.2019.8998886 ◽

2019 ◽

Author(s):

Ashish Kumar ◽

Raj Kumar Kokkonda ◽

Subhashish Bhattacharya ◽

Victor Veliadis

Keyword(s):

Single Shot ◽

Parallel Connection ◽

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Fabrication and characterization of high-current-density carbon-nanotube cold cathodes

Applied Surface Science ◽

10.1016/j.apsusc.2005.03.185 ◽

2005 ◽

Vol 251 (1-4) ◽

pp. 249-253 ◽

Author(s):

Chunhui Zhu ◽

Chaogang Lou ◽

Wei Lei ◽

Xiaobing Zhang

Keyword(s):

Carbon Nanotube ◽

Current Density ◽

High Current Density ◽

High Current ◽

Cold Cathodes ◽

Fabrication And Characterization

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Characterization of the average pore diameter of nanoporous media by gas permeability measurement technique in transitional flow regime

Vacuum ◽

10.1016/j.vacuum.2021.110596 ◽

2021 ◽

pp. 110596

Author(s):

Xudi Wang ◽

Renchao Chang ◽

Yunsheng Ding ◽

Bin Zhou ◽

Qing Cao ◽

...

Keyword(s):

Flow Regime ◽

Measurement Technique ◽

Pore Diameter ◽

Gas Permeability ◽

Average Pore Diameter ◽

Transitional Flow ◽

Permeability Measurement ◽

Average Pore ◽

Nanoporous Media

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Characterization of a Xenon plasma electron flood gun on a GSD-200E/sup 2/ high current implanter using Q/sub BD/, FLASH, SPIDER, and CHARM/sup TM/-2 wafers

2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) ◽

10.1109/iit.2000.924212 ◽

2003 ◽

Author(s):

P. Kopalidis ◽

Y. Erokhin ◽

R. Santiesteban ◽

V. Soncini

Keyword(s):

Plasma Electron ◽

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Characterization of 1.2 kV SiC Power MOSFETs at Cryogenic Temperatures

2018 IEEE Energy Conversion Congress and Exposition (ECCE) ◽

10.1109/ecce.2018.8557442 ◽

2018 ◽

Author(s):

Handong Gui ◽

Ren Ren ◽

Zheyu Zhang ◽

Ruirui Chen ◽

Jiahao Niu ◽

...

Keyword(s):

Cryogenic Temperatures ◽

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