Soft X-ray characterization of perpendicular recording media

2002 ◽  
Vol 38 (4) ◽  
pp. 1693-1697 ◽  
Author(s):  
E.E. Fullerton ◽  
O. Hellwig ◽  
Y. Ikeda ◽  
B. Lengsfield ◽  
K. Takano ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
X Ray

Characterization of an x-ray framing camera utilizing a charge coupled device or film as recording media

1998 ◽  
Vol 69 (12) ◽  
pp. 4054-4060 ◽  
Author(s):  
L. M. Logory ◽  
D. R. Farley ◽  
A. D. Conder ◽  
E. A. Belli ◽  
P. M. Bell ◽  
...  
Keyword(s):  
Recording Media ◽  
Charge Coupled Device ◽  
X Ray ◽  
A Charge ◽  
Framing Camera

Magnetic Characterization of Perpendicular Recording Media

2016 ◽  
pp. 385-456 ◽  
Author(s):  
Gaspare Varvaro ◽  
Alberto Testa ◽  
Elisabetta Agostinelli ◽  
Davide Peddis ◽  
Sara Laureti
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Magnetic Characterization

Precise noise characterization of perpendicular recording media

2000 ◽  
Vol 87 (9) ◽  
pp. 4987-4989 ◽  
Author(s):  
Akihiko Takeo ◽  
Yuka Takahashi ◽  
Yoichiro Tanaka ◽  
Kenji Miura ◽  
Hiroaki Muraoka ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Noise Characterization

scholarly journals Characterization of Perpendicular Recording Media of CoPtCrO Granular Thin Films.

2001 ◽  
Vol 25 (3−2) ◽  
pp. 226-229 ◽  
Author(s):  
R. Sbiaa ◽  
E. Ahmad ◽  
T. Suzuki ◽  
A. Takeo ◽  
Y. Tanaka
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording

Extracting magnetic cluster size and its distributions in advanced perpendicular recording media with shrinking grain size using small angle x-ray scattering

2015 ◽  
Vol 106 (20) ◽  
pp. 202403 ◽  
Author(s):  
Virat Mehta ◽  
Tianhan Wang ◽  
Yoshihiro Ikeda ◽  
Ken Takano ◽  
Bruce D. Terris ◽  
...  
Keyword(s):  
Grain Size ◽  
Small Angle ◽  
Cluster Size ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Magnetic Cluster ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

1992 ◽  
Vol 36 ◽  
pp. 197-202
Author(s):  
Po-Wen Wang
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Depth Resolution ◽  
Grazing Incidence ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Relationship

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.

Noise Characterization of Perpendicular Recording Media by Cluster Size Measurements

2014 ◽  
Vol 50 (5) ◽  
pp. 1-6 ◽  
Author(s):  
Binni Varghese ◽  
S. N. Piramanayagam ◽  
Wee Kiat Lee ◽  
Hang Khume Tan
Keyword(s):  
Cluster Size ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Noise Characterization

X-ray photoelectron spectroscopy of annealed Co-Cr films

1991 ◽  
Vol 49 ◽  
pp. 750-751
Author(s):  
B.G. Demczyk ◽  
H.W. Estry
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Recording Media ◽  
Perpendicular Recording ◽  
X Ray ◽  
Alloy Target ◽  
Compositional Changes ◽  
Sputtering System

Co-Cr thin films have been studied extensively as leading candidates for perpendicular recording media. The enhancement of the magnetic properties (saturation magnetization and coercivity) in rfsputtered Co-Cr films has been reported by several investigators. Concurrent work has revealed similar improvements in the magnetic properties of annealed Co-Cr films produced by magnetron sputtering. Honda et al. propose that compositional inhomogeneities in annealed films give rise to these properties changes. In this work, we have employed X-ray photoelectron spectroscopy (XPS) to investigate compositional changes in annealed Co-Cr layers of thickness 10-200 nm.Films were deposited from a Co-22wt%Cr alloy target onto glass (Coming Type 7059) substrates using a Varian DC Magnetron ("S" gun) sputtering system. Sputtering conditions included an argon pressure of lmTorr and room temperature substrates. The sputtering rate was 0.25 nm/sec. Annealing was performed at 360°C in a vacuum (10-6 Torr) in incremental times up to 49 hours.

scholarly journals Magnetic characterization of perpendicular recording media

2002 ◽  
Vol 38 (4) ◽  
pp. 1682-1686 ◽  
Author(s):  
Jing Wu ◽  
L. Holloway ◽  
H. Laidler ◽  
K. O'Grady ◽  
S. Khizroev ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Magnetic Characterization
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