Investigation of the Effect of Microstructure and Grain Boundaries in Nanostructured CMR Thin Films Using Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP)
2006 ◽
Vol 5
(6)
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pp. 707-711
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1990 ◽
pp. 1093-1099
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1999 ◽
Vol 147
(1-4)
◽
pp. 140-145
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1997 ◽
Vol 12
(8)
◽
pp. 1942-1945
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Keyword(s):
1996 ◽
Vol 14
(2)
◽
pp. 1349
◽
Keyword(s):