Post-Gate Plasma and Sputter Process Effects on the Radiation Hardness of Metal Gate CMOS Integrated Circuits
1978 ◽
Vol 25
(6)
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pp. 1459-1464
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Keyword(s):
Keyword(s):
1979 ◽
Vol 26
(6)
◽
pp. 5180-5184
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1978 ◽
Vol 25
(6)
◽
pp. 1172-1175
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Keyword(s):
1987 ◽
Vol 34
(6)
◽
pp. 1769-1774
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1991 ◽
Vol 38
(2)
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pp. 269-276
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Keyword(s):
2013 ◽
Vol 60
(3)
◽
pp. 2074-2100
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Keyword(s):
1977 ◽
Vol 16
(3)
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pp. 251-254
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