TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultra-High Doses
1977 ◽
Vol 35
◽
pp. 440-441
1992 ◽
Vol 50
(1)
◽
pp. 668-669
2004 ◽
Vol 171
(4S)
◽
pp. 424-424
◽