3D-carrier Profiling and Parasitic Resistance Analysis in Vertically Stacked Gate-All-Around Si Nanowire CMOS Transistors

Author(s):  
P. Eyben ◽  
J. Machillot ◽  
M. Kim ◽  
T. Miyashita ◽  
N. Yoshida ◽  
...  
Author(s):  
Stefano Bonaldo ◽  
Mariia Gorchichko ◽  
En Xia Zhang ◽  
Teng Ma ◽  
Serena Mattiazzo ◽  
...  

2019 ◽  
Vol 13 (1) ◽  
pp. 201-211 ◽  
Author(s):  
Narayanan Balasubramanian ◽  
Navab Singh ◽  
Subhash C. Rustogi ◽  
Kavitha D. Buddharaju ◽  
J Fu ◽  
...  

Author(s):  
Mariia Gorchichko ◽  
En Xia Zhang ◽  
Pan Wang ◽  
Stefano Bonaldo ◽  
Ronald D. Schrimpf ◽  
...  

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