Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in the Presence of Process Variations

Author(s):  
Mohsen Raji ◽  
Behnam Ghavami
2010 ◽  
Vol 4 (4) ◽  
pp. 325-333 ◽  
Author(s):  
Q. Ding ◽  
H. Yang ◽  
Y. Wang ◽  
H. Wang ◽  
R. Luo

2009 ◽  
Vol 25 (2-3) ◽  
pp. 197-207 ◽  
Author(s):  
Mihir R. Choudhury ◽  
Quming Zhou ◽  
Kartik Mohanram

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