Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND flash memory

Author(s):  
Bongsik Choi ◽  
Sang Hyun Jang ◽  
Jinsu Yoon ◽  
Juhee Lee ◽  
Minsu Jeon ◽  
...  
Author(s):  
Nagyong Choi ◽  
Ho-Jung Kang ◽  
Sungyong Chung ◽  
Sung-Ho Bae ◽  
Byung-Gook Park ◽  
...  

2020 ◽  
Vol 8 ◽  
pp. 62-66 ◽  
Author(s):  
Xinlei Jia ◽  
Lei Jin ◽  
Wei Hou ◽  
Zhiyu Wang ◽  
Songmin Jiang ◽  
...  

2019 ◽  
Vol 46 (1) ◽  
pp. 106-106 ◽  
Author(s):  
Yixin Luo ◽  
Saugata Ghose ◽  
Yu Cai ◽  
Erich F. Haratsch ◽  
Onur Mutlu

IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 47391-47398
Author(s):  
Fei Wang ◽  
Yuan Li ◽  
Xiaolei Ma ◽  
Jiezhi Chen

Sign in / Sign up

Export Citation Format

Share Document