scholarly journals More Than a Feeling

2006 ◽  
Vol 128 (04) ◽  
pp. 31-33 ◽  
Author(s):  
F. Michael Serry

The atomic force microscope (AFM) is enabling engineers to understand mechanical systems at the most basic level. The heart of the AFM is a probe comprising a microfabricated cantilever with an extraordinarily sharp tip. The AFM tip can be thought of as a nanometer-scale finger that we have at our disposal to interface with matter on the scale of individual molecules, and even atoms. The paper highlights that it is the only instrument that allows us to ‘touch’ the surface of a sample with nanometer-scale resolution and atomic-level force sensitivity. Researchers using AFM have now established that after relatively weak bonds break, untying segments of a relatively large structural molecule, the energy needed to stretch the untied segment can be orders of magnitude larger than the broken bond's energy. The AFM has evolved into a highly modular instrument. Advanced AFMs such as the BioScope II from Veeco Instruments operate in liquid to image and probe biologically important matter, both organic and synthetic. Also, there are AFMs for operating in vacuum, useful in investigating properties of matter without a water layer adsorbed on it, or for probing tip-sample interactions with highly sensitive probes in long range or in contact.

1998 ◽  
Vol 4 (S2) ◽  
pp. 334-335
Author(s):  
D.N. Leonard ◽  
A.D. Batchelor ◽  
P.E. Russell

The atomic force microscope (AFM) has allowed microscopists to observe surface topography of non-conductive samples on the atomic level. One AFM mode that scanned probe microscopists have recently shown an interest in is the phase lag imaging mode. It has already been demonstrated that the resulting phase lag data can be used to identify different densities of microlayered polyethylene. However a quantitative understanding of phase lag imaging has yet to be fully developed. With a better understanding of the phase lag data it may be possible to estimate the modulus or other material properties of a sample from an AFM phase image alone.The need for better understanding phase lag data is essential to increasing the knowledge of a how a material's microstructure behaves on the nanometer scale. This investigation focused on AFM phase lag data produced while scanning microstructures with large differences in modulus values between the compositional phases.


Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.


1997 ◽  
Vol 63 (3) ◽  
pp. 426-430 ◽  
Author(s):  
Shojiro MIYAKE ◽  
Masanori ISHII ◽  
Toshiaki OTAKE ◽  
Naotake TSUSHIMA

1999 ◽  
Vol 584 ◽  
Author(s):  
A. Notargiacomo ◽  
E. Giovine ◽  
E. Cianci ◽  
V. Foglietti ◽  
F. Evangelisti

AbstractScanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices.Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.


2008 ◽  
Vol 47 (7) ◽  
pp. 6181-6185 ◽  
Author(s):  
Futoshi Iwata ◽  
Kouhei Ohara ◽  
Yuichi Ishizu ◽  
Akira Sasaki ◽  
Hisayuki Aoyama ◽  
...  

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