A Comprehensive Investigation on Tribological Performance of Nano-Silver and Nano-Gold Additivated Fluids on Wearing Surfaces

2020 ◽  
Vol 142 (8) ◽  
Author(s):  
Seyma Korkmaz ◽  
M. Huseyin Cetin ◽  
Sevval Dogan ◽  
Kadir Ozen ◽  
Enes Ayhan ◽  
...  
Keyword(s):  
Ethylene Glycol ◽  
Three Dimensional ◽  
Colloidal Suspensions ◽  
Silver Particles ◽  
Plate Method ◽  
Comprehensive Investigation ◽  
X Ray ◽  
Nano Silver ◽  
Nano Gold ◽  
Atomic Force

Abstract In this study, the tribological performances of the colloidal suspensions with the additives of nano-silver and nano-gold were examined via wear experiments of AA7075-T6 material. The nanoparticles were penetrated in the wear region using suspensions prepared in distilled water and ethylene glycol environment. The wear experiments were performed under 30 N load and 20 rpm speed condition in 1000 m wear distance using the ball-on-plate method. The worn surfaces were analyzed with a three-dimensional profilometer, scanning electron microscope/energy-dispersive X-ray (EDX), and atomic force microscope (AFM) methods. According to the results, the colloidal dispersed nano-gold particles in ethylene glycol performed 28.85% better on reducing the surface roughness, 2.32% on reducing the weight loss, 4.85% on increasing the heat transfer, and 1.22% on reducing the friction coefficient than the nano-silver particles.

scholarly journals In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Vol 2 (4) ◽  
pp. 24 ◽  
Author(s):  
Anton Davydok ◽  
Thomas Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

Differential height characteristics of plasmid and G-wire DNA as determined by AFM

1994 ◽  
Vol 52 ◽  
pp. 1052-1053
Author(s):  
T. C. Marsh ◽  
J. Vesenka ◽  
E. Henderson
Keyword(s):  
Plasmid Dna ◽  
Structural Characteristics ◽  
Three Dimensional ◽  
Helical Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dimension One

Atomic-Force Microscopy (AFM) has become an effective tool in the three dimensional characterization of biological systems and is capable of Angstrom sensitivity in the vertical dimension. One unresolved dilemma is that the observed height (diameter) of B-DNA being about 10Å, is less than half its x-ray diffraction value. In this paper we attempt to determine the source of this discrepancy by comparing plasmid DNA co-deposited with a novel form of DNA called “G-wires” (Figure 1). G-wires are formed by G-rich sequences. They are composed of G-4 DNA, a quadruple helical structure. X-ray data of G-4 DNA gives a diameter of 27Å, comparable to that expected for B-DNA (20 to 25Å). In the AFM these structures have a significantly greater height (av. = 22 Å) compared to double stranded (av. = 7 Å) or supercoiled B-DNA (av. = 14 Å) (Figure 2). Thus, the apparent height of nucleic acids in the AFM is dependent upon their innate structural characteristics.

Bridging structure and mechanics of three-dimensional porous hydrogel with X-ray ultramicroscopy and atomic force microscopy

RSC Advances ◽  
2015 ◽  
Vol 5 (78) ◽  
pp. 63909-63916 ◽  
Author(s):  
A. Y. Abuelfilat ◽  
Y. Kim ◽  
P. Miller ◽  
S. P. Hoo ◽  
J. Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Collective Performance ◽  
Porous Hydrogel

By combining phase contrast X-ray ultramicroscopy and nanoindentation with atomic force microscopy, the mechanics of individual hydrogel pores as well as their collective performance as a scaffold can be modelled and simulated.

scholarly journals Multifractal characterization of epitaxial silicon carbide on silicon

2017 ◽  
Vol 35 (3) ◽  
pp. 539-547
Author(s):  
Ştefan Ţălu ◽  
Sebastian Stach ◽  
Shikhgasan Ramazanov ◽  
Dinara Sobola ◽  
Guseyn Ramazanov
Keyword(s):  
Silicon Carbide ◽  
Surface Condition ◽  
Three Dimensional ◽  
Epitaxial Silicon ◽  
Large Area ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nano Size

AbstractThe purpose of this study was to investigate the topography of silicon carbide films at two steps of growth. The topography was measured by atomic force microscopy. The data were processed for extraction of information about surface condition and changes in topography during the films growth. Multifractal geometry was used to characterize three-dimensional micro- and nano-size features of the surface. X-ray measurements and Raman spectroscopy were performed for analysis of the films composition. Two steps of morphology evolution during the growth were analyzed by multifractal analysis. The results contribute to the fabrication of silicon carbide large area substrates for micro- and nanoelectronic applications.

One-Pot Synthesis of Nanodendritic PtIr Alloy with High Electrochemical Activity for Ethylene Glycol Oxidation

NANO ◽  
2017 ◽  
Vol 12 (02) ◽  
pp. 1750026 ◽  
Author(s):  
Xuedong Gao ◽  
Lulu Liu ◽  
Qiyu Wang ◽  
Kun Qi ◽  
Zhao Jin ◽  
...  
Keyword(s):  
Ethylene Glycol ◽  
Photoelectron Spectroscopy ◽  
Three Dimensional ◽  
One Pot ◽  
X Ray ◽  
Electrochemical Tests ◽  
Transmission Electron ◽  
Ethylene Glycol Oxidation ◽  
Networks Structure ◽  
20 Nm

Nanodendritic Pt-based bimetallic alloys are one promising catalyst with three-dimensional (3D) networks structure composed of integrating branches for electrochemical catalytic reaction. We successfully synthesized dendrites Pt6Ir4 alloy with small size of 20 nm in oleylamine. The dendritic Pt6Ir4 alloy are characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The electrochemical tests suggest that the as-prepared dendritic Pt6Ir4 alloy exhibits greatly enhanced ethylene glycol oxidation reaction (EGOR) activity than commercial Pt/C with high EGOR mass activity, anti-poisoning and stability.

Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis

2017 ◽  
Vol 50 (2) ◽  
pp. 399-410 ◽  
Author(s):  
Sérgio L. Morelhão ◽  
Celso I. Fornari ◽  
Paulo H. O. Rappl ◽  
Eduardo Abramof
Keyword(s):  
Bismuth Telluride ◽  
Three Dimensional ◽  
Strongly Correlated ◽  
Synchrotron Source ◽  
X Ray ◽  
Force Microscopy ◽  
Area Detector ◽  
Atomic Force ◽  
Nanoscale Characterization ◽  
Recursive Equations

The surface properties of topological insulators are strongly correlated with their structural properties, requiring high-resolution techniques capable of probing both surface and bulk structures at once. In this work, the high flux of a synchrotron source, a set of recursive equations for fast X-ray dynamical diffraction simulation and a genetic algorithm for data fitting are combined to reveal the detailed structure of bismuth telluride epitaxial films with thicknesses ranging from 8 to 168 nm. This includes stacking sequences, thickness and composition of layers in model structures, interface coherence, surface termination, and morphology. The results are in agreement with the surface morphology determined by atomic force microscopy. Moreover, by using X-ray data from a zero-noise area detector to construct three-dimensional reciprocal-space maps, insights into the nanostructure of the domains and stacking faults in Bi2Te3 films are given.

Nitridation of Substrates With Hydrazine Cyanurate for The Growth of Gallium Nitride

1998 ◽  
Vol 512 ◽  
Author(s):  
T. J. Kropewnicki ◽  
P. A. Kohl
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Composition ◽  
Low Temperature ◽  
Surface Morphology ◽  
Photoelectron Spectroscopy ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dimensional Growth

ABSTRACTThe use of purified hydrazine cyanurate as a solid source of hydrazine in the low temperature nitridation of GaAs (100) and (111) and sapphire (0001) is demonstrated. Thenitridated surfaces were analyzed by X-ray Photoelectron Spectroscopy (XPS) for chemical composition and Atomic Force Microscopy for surface morphology. The GaAs surfaces were composed primarily of GaN, GaAs, and Ga2O3, and were as smooth as unprocessed standards. The nitridated sapphire surfaces were composed of A1NxO1-x and exhibited three-dimensional growth for long nitridation times.

Three-dimensional readout of flash x-ray images of living sperm in water by atomic-force microscopy

Science ◽  
1991 ◽  
Vol 252 (5006) ◽  
pp. 691-693 ◽  
Author(s):  
T Tomie ◽  
H Shimizu ◽  
T Majima ◽  
M Yamada ◽  
T Kanayama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Author(s):  
Anton Davydok ◽  
Thomas W. Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed with an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. While three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves, they were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire is visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion is detected. Bending and torsion angles are quantified from the high resolution diffraction data.

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