Yield Inception of a Coated Substrate Indented by a Rigid Sphere
Keyword(s):
Yield inception of a coated substrate indented by a rigid sphere is analyzed using finite element analysis. The critical interference is studied as a function of film thickness and material properties of both the film and the substrate. The results show that critical interference, corresponding to yield inception of the coated substrate, is a strong function of the film thickness, the Young’s modulus, and the yield strength of both the film and the substrate.
2006 ◽
Vol 326-328
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pp. 219-222
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2010 ◽
Vol 218
(1)
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pp. 59-74
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2017 ◽
Vol 129
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pp. 195-203
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2005 ◽
Vol 54
(10)
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pp. 1016-1021
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2021 ◽
Vol 21
(5)
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pp. 2987-2991
2004 ◽
Vol 28
(6)
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pp. 848-859
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