Surface potential measurement with high spatial resolution using a scanning Auger electron microscope

2001 ◽  
Vol 19 (4) ◽  
pp. 1139-1142 ◽  
Author(s):  
Y. Sakai ◽  
M. Kudo ◽  
C. Nielsen
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Surface Potential ◽  
Auger Electron ◽  
High Spatial Resolution ◽  
Potential Measurement

High-Spatial-Resolution Cathodoluminescence Measurement of InGaN

2002 ◽  
Vol 743 ◽  
Author(s):  
Hisashi Kanie ◽  
Hiroaki Okado ◽  
Takaya Yoshimura
Keyword(s):  
Electron Microscope ◽  
Energy Level ◽  
Spatial Resolution ◽  
Diffusion Length ◽  
High Spatial Resolution ◽  
Lower State ◽  
Measuring Apparatus ◽  
Bulk Crystals ◽  
Recombination Centers ◽  
Scanning Electron

ABSTRACTThis paper described observation of cathodoluminescence (CL) of microcrystalline InGaN bulk crystals under a scanning electron microscope (SEM) with a high-spatial-resolution (HR) CL measuring apparatus. HR-CL spectra from facets of InGaN crystals vary from facet to facet and are single peaked. Histogram analysis of the CL peak positions of HR spectra from the facets of the crystals in the area scanned during a low-resolution CL measurement shows a two-peaked form with comparable peak wavelengths. The diffusion length of a generated electron- ho le pair or an exciton from the recombination centers with a higher-energy-level state to that with a lower state is estimated to be 500 nm at the longest by the comparison of two monochromatic HR-CL images of adjoining facets.

High spatial resolution surface potential measurements using secondary electrons

1980 ◽  
Vol 93 (2-3) ◽  
pp. A100-A101
Author(s):  
A.P. Janssen ◽  
P. Akhter ◽  
C.J. Harland ◽  
J.A. Venables
Keyword(s):  
Spatial Resolution ◽  
Surface Potential ◽  
High Spatial Resolution ◽  
Secondary Electrons ◽  
Surface Potential Measurements

Kelvin Probe Force Microscope Measurement Uncertainty

2011 ◽  
Vol 222 ◽  
pp. 114-117
Author(s):  
Maciej Ligowski ◽  
Michiharu Tabe ◽  
Ryszard Jabłoński
Keyword(s):  
Measurement Uncertainty ◽  
Spatial Resolution ◽  
Surface Potential ◽  
High Spatial Resolution ◽  
High Sensitivity ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Calibration Methods ◽  
Standard Calibration ◽  
Nanoscale Measurements

Kelvin Probe Force Microscopy is an attractive technique for characterizing the surface potential of various samples. The main advantage of this technique is its high spatial resolution together with high sensitivity. However as in any nanoscale measurements also in case of KFM it is extremly difficult to describe the uncertainty of the measurement. Moreover, a wide variety of measuring conditions, together with the complicated operation principle cause situation, where no standard calibration methods are available. In the paper we propose the model of the KFM microscope and analyze the uncertainty of the KFM measurement.

High Spatial Resolution Spin-Polarized Scanning Electron Microscope

1985 ◽  
Vol 24 (Part 2, No. 10) ◽  
pp. L833-L834 ◽  
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama ◽  
Hideo Todokoro ◽  
Kazunobu Hayakawa
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Spin Polarized ◽  
Scanning Electron
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