Characterization of bis(tertiary-butylamino)silane-based low-pressure chemical vapor deposition silicate glass films

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Richard Conti ◽  
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James Ellenberger
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Vol 308-309 ◽  
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T.C Chang ◽  
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L.J Chen ◽  
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Vol 539 ◽  
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C. Aguilera ◽  
J.C. González ◽  
A. Borrás ◽  
D. Margineda ◽  
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...  

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