Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques

2010 ◽  
Vol 28 (1) ◽  
pp. C1C84-C1C89 ◽  
Author(s):  
Damiano Giubertoni ◽  
Erica Iacob ◽  
P. Hoenicke ◽  
B. Beckhoff ◽  
Giancarlo Pepponi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Grazing Incidence ◽  
Mass Spectrometry Analysis ◽  
X Ray ◽  
Spectrometry Analysis ◽  
Ultralow Energy ◽  
Fluorescence Techniques ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Calculation of Membrane Lipid Ratios Using Single-Pixel Time-of-Flight Secondary Ion Mass Spectrometry Analysis

2015 ◽  
Vol 87 (15) ◽  
pp. 7795-7802 ◽  
Author(s):  
Rainer Kassenböhmer ◽  
Felix Draude ◽  
Martin Körsgen ◽  
Andreas Pelster ◽  
Heinrich F. Arlinghaus
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Membrane Lipid ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Lipid Ratios ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Single Pixel
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