Ultrashallow Boron Junctions in Silicon Characterization by Secondary Ion Mass Spectrometry and Synchrotron Radiation Grazing Incidence X-Ray Fluorescence Techniques

2009 ◽  
Keyword(s):  
Mass Spectrometry ◽  
Synchrotron Radiation ◽  
Secondary Ion Mass Spectrometry ◽  
Grazing Incidence ◽  
X Ray ◽  
Fluorescence Techniques ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

2021 ◽  
Author(s):  
Lluís Yedra ◽  
C. N. Shyam Kumar ◽  
Alisa Pshenova ◽  
Esther Lentzen ◽  
Patrick Philipp ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Energy Dispersive ◽  
New Method ◽  
X Ray ◽  
Edx Analysis ◽  
Ion Mass Spectrometry ◽  
Trace Concentrations ◽  
Secondary Ion

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

2014 ◽  
Vol 59 (2) ◽  
pp. 173-180 ◽  
Author(s):  
Bianca Kyriacou ◽  
Katie L. Moore ◽  
David Paterson ◽  
Martin D. de Jonge ◽  
Daryl L. Howard ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Fluorescence Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Rice Grain ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
Sign in / Sign up

Export Citation Format

Share Document