High-voltage energy dispersive x-ray spectrometry using a low-energy primary beam

Author(s):  
Ying Wu ◽  
Dimitri Klyachko ◽  
Scott Davilla ◽  
James Spallas ◽  
Scott Indermuehle ◽  
...  
1979 ◽  
Vol 23 ◽  
pp. 231-239 ◽  
Author(s):  
Ronald A. Vane ◽  
William D. Stewart

AbstractPrimary beam transmission filters in energy dispersive X-ray fluorescence (EDXRF) analysis are used to shape the spectral output of the X-ray tube. The effective use of these filters allows the optimization of excitation conditions for each different analysis. Filters are used in two basic ways in EDXRF; either as edge filters or as white filters. The proper choice of filter and excitation conditions optimizes the analysis of a particular element or spectral region by shaping the primary radiation to reduce background and to maximize excitation.


2019 ◽  
Vol 87 (2) ◽  
pp. 67-73 ◽  
Author(s):  
Michele Boracchi ◽  
Graziano Domenico Luigi Crudele ◽  
Guendalina Gentile ◽  
Francesca Maciocco ◽  
Francesca Maghin ◽  
...  

Literature on electrocution in Italy is limited. The authors have focused their attention on the use of scanning electron microscope/energy-dispersive X-ray analysis in order to evaluate the current mark even on paraffin-embedded samples. A total of 24,104 autopsies were performed at the Section of Legal Medicine of Milan (1993–2017); all cases of death caused by electrocution (low and high voltage) were selected. We assessed a regular histological examination, a toxicological examination and detected metallisation with energy-dispersive X-ray spectroscopy analysis on paraffin-embedded tissues of typical current marks. We collected 27 high-voltage fatalities and five cases of low-voltage suicide electrocution; the technique revealed itself as sensitive. In all cases, microscopic examination highlighted the typical signs of electric current and thermal damage but the histochemical specific stainings for copper and iron gave negative results. Scanning electron microscope/energy-dispersive X-ray analysis, assessed on these same samples, even when paraffin-embedded, however, enabled us to detect these elements and differentiate between the various metal residues involved in the electrocution process. Based on their experience, authors advise the use of scanning electron microscope/energy-dispersive X-ray analysis on electrocution deaths to provide information for forensic diagnosis.


1979 ◽  
Vol 23 ◽  
pp. 249-256
Author(s):  
M. Singh ◽  
A.J. Dabrowski ◽  
G.C. Huth ◽  
J.S. Iwanczyk ◽  
B.C. Clark ◽  
...  

We have previously reported on the uniqueness and potential of room-temperature spectrometry of low-energy x-rays with a mercuric iodide (HgI2) detector (1,2,3). In this paper we emphasize the use of HgI2 detectors for x-ray fluorescence (XRF) analysis.Because no vacuum plumbing or cryogenic cooling is required, the design of a mercuric iodide room-temperature x-ray spectrometer is extremely simple. Our present design consists of coupling a detector directly to the first-stage FET in a modified Tennelec 161 D preamplifier and making the configuration “light-tight”. Aside from providing a suitable entrance window, there are no other requirements for routine spectroscopy.


1986 ◽  
Vol 25 (Part 1, No. 9) ◽  
pp. 1431-1434 ◽  
Author(s):  
Keiko Nishikawa ◽  
Keiko Ishizawa ◽  
Yasuto Kodera ◽  
Takao Iijima

1977 ◽  
Vol 21 ◽  
pp. 229-240
Author(s):  
J.C. Russ ◽  
R. Jenkins ◽  
R.B. Shen ◽  
A.O. Sandborg

Instrument specifications as published by manufacturers generally include values for stability of various parameters or components. For an X-ray fluorescence system, a typical example might be the generator high voltage stability (perhaps 0.01%). Parameters of this sort are of course of some use in comparing systems, and they may be (and often are) of great importance to the manufacturer as a criterion of manufacturing quality. It is difficult for the user to know how any single one, or combination of these factors really affect the total system performance as it may relate to his application.


2009 ◽  
Vol 15 (S2) ◽  
pp. 218-219
Author(s):  
RE Edelmann ◽  
V Vasudevan ◽  
D Kohls ◽  
J Ullmer

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009


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