Silicon structures for in situ characterization of atomic force microscope probe geometry

1996 ◽  
Vol 14 (6) ◽  
pp. 3425 ◽  
Author(s):  
K. F. Jarausch
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
In Situ Characterization ◽  
Atomic Force ◽  
Silicon Structures ◽  
Microscope Probe ◽  
Probe Geometry

scholarly journals In situ Investigation of Individual Filament Growth in Conducting Bridge Memristor by Contact Scanning Capacitance Microscopy

2021 ◽  
Vol 2086 (1) ◽  
pp. 012205
Author(s):  
M A Ryabova ◽  
D A Antonov ◽  
A V Kruglov ◽  
I N Antonov ◽  
D O Filatov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Filament Length ◽  
Atomic Force Microscope Probe ◽  
Scanning Capacitance Microscopy ◽  
Atomic Force ◽  
In Situ Investigation ◽  
Conducting Bridge ◽  
Microscope Probe ◽  
Individual Filament

Abstract We report on the application of Contact Scanning Capacitance Microscopy (CSCM) to trace the growth of an individual Ni filament in a ZrO2(Y) film on a Ni sublayer (together with a conductive Atomic Force Microscope probe composing a nanometer-sized virtual memristor). An increasing of the filament length in the course of electro-forming results in an increasing of the capacitance between the probe and the sample, which can be detected by CSCM technique. This way, the filament growth can be monitored in real time in situ.

In Situ Characterization of the Mechanical Behavior of Gecko's Spatulae by Atomic Force Microscopy

2013 ◽  
Vol 22 ◽  
pp. 85-93
Author(s):  
Shuang Yi Liu ◽  
Min Min Tang ◽  
Ai Kah Soh ◽  
Liang Hong
Keyword(s):  
Mechanical Behavior ◽  
Hierarchical Level ◽  
Intrinsic Properties ◽  
In Situ Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Theoretical Predictions ◽  
Multi Mode

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe

2007 ◽  
Vol 33 (10) ◽  
pp. 889-892 ◽  
Author(s):  
M. S. Dunaevskii ◽  
A. N. Titkov ◽  
S. Yu. Larkin ◽  
A. B. Speshilova ◽  
S. E. Aleksandrov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Nanocrystals ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe
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