Influence of HfO2 and SiO2 interfacial layers on the characteristics of n-GaN/HfSiOx capacitors using plasma-enhanced atomic layer deposition
2021 ◽
Vol 39
(6)
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pp. 062405
2018 ◽
Vol 6
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pp. 950-955
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Keyword(s):
2012 ◽
Vol 59
(9)
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pp. 2350-2356
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Keyword(s):
2008 ◽
Keyword(s):