Optical sensors for on-line inspection of industrial materials

1993 ◽  
Vol 32 (9) ◽  
pp. 2130 ◽  
Author(s):  
Paolo G. Cielo
Keyword(s):  
Optical Sensors ◽  
On Line ◽  
Industrial Materials

On-line carbon balance of yeast fermentations using miniaturized optical sensors

2012 ◽  
Vol 113 (3) ◽  
pp. 399-405 ◽  
Author(s):  
Thomas Beuermann ◽  
Dominik Egly ◽  
Daniel Geoerg ◽  
Kerris Isolde Klug ◽  
Winfried Storhas ◽  
...  
Keyword(s):  
Optical Sensors ◽  
Carbon Balance ◽  
On Line

scholarly journals Calibration of an in-situ fluorescence based sensor platform for reliable BOD5 measurement in wastewater

2021 ◽  
Author(s):  
K. Khamis ◽  
C. Bradley ◽  
H. J. Gunter ◽  
G. Basevi ◽  
R. Stevens ◽  
...  
Keyword(s):  
Optical Sensors ◽  
Wastewater Treatment Plants ◽  
Oxygen Demand ◽  
Laboratory Measurements ◽  
Fluorescence Sensors ◽  
Sensor Platform ◽  
Wastewater Quality ◽  
On Line ◽  
Lag Times

Abstract Reliance on Biochemical Oxygen Demand (BOD5) as an indicator of wastewater quality has hindered development of efficient process control due to the associated uncertainty and lag-times. Surrogate measurements have been proposed, with fluorescence spectroscopy a promising technique. Yet, assessment of in-situ fluorescence sensors across multiple Wastewater Treatment Plants (WwTPs), and at different treatment stages, is limited. In this study a multi-parameter sonde (two fluorescence peaks, turbidity, temperature and electrical conductivity) was used to provide a BOD5 surrogate measurement. The sonde was deployed at three WwTPs, on post primary settlement tanks (PST) and final effluent (FE). Triplicate laboratory measurements of BOD5, from independent laboratories were used to calibrate the sensor, with high variability apparent for FE samples. Site and process specific sensor calibrations yielded the best results (R2cv = 0.76–0.86; 10-fold cross-validation) and mean BOD5 of the three laboratory measurements improved FE calibration. When combining PST sites a reasonable calibration was still achieved (R2cv = 0.67) suggesting transfer of sensors between WwTPs may be possible. This study highlights the potential to use on-line optical sensors as robust BOD5 surrogates in WwTPs. However, careful calibration (i.e. replicated BOD5 measurements) is required for FE as laboratory measurements can be associated with high uncertainty.

scholarly journals Data Analytics for Noise Reduction in Optical Metrology of Reflective Planar Surfaces

Machines ◽  
2021 ◽  
Vol 10 (1) ◽  
pp. 25
Author(s):  
Cody Berry ◽  
Marcos S. G. Tsuzuki ◽  
Ahmad Barari
Keyword(s):  
Noise Reduction ◽  
Optical Sensors ◽  
Data Analytics ◽  
Essential Element ◽  
Optical Metrology ◽  
Metallic Surfaces ◽  
Planar Surfaces ◽  
Coordinate Metrology ◽  
On Line ◽  
Global Statistic

On-line data collection from the manufactured parts is an essential element in Industry 4.0 to monitor the production’s health, which required strong data analytics. The optical metrology-based inspection of highly reflective parts in a production line, such as parts with metallic surfaces, is a difficult challenge. As many on-line inspection paradigms require the use of optical sensors, this reflectivity can lead to large amounts of noise, rendering the scan inaccurate. This paper discusses a method for noise reduction and removal in datapoints resulting from scanning the reflective planar surfaces. Utilizing a global statistic-based iterative approach, noise is gradually removed from the dataset at increasing percentages. The change in the standard deviation of point-plane distances is examined, and an optimal amount of noisy data is removed to reduce uncertainty in representing the workpiece. The developed algorithm provides a fast and efficient method for noise reduction in optical coordinate metrology and scanning.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

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