scholarly journals X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development

2019 ◽  
Author(s):  
Atefeh Jafari ◽  
Finn E. Christensen ◽  
Sonny Massahi ◽  
Sara Svendsen ◽  
Lan M. Vu ◽  
...  
Keyword(s):  
Reference Sample ◽  
X Ray ◽  
Platinum Coating

Development of 3D Printing Technology with Ceramic Paste and Study of Properties of Printed Corundum Products

2021 ◽  
Vol 1040 ◽  
pp. 178-184
Author(s):  
Andrey S. Dolgin ◽  
Aleksei I. Makogon ◽  
Sergey P. Bogdanov
Keyword(s):  
3D Printing ◽  
Aluminum Oxide ◽  
Reference Sample ◽  
Physical And Mechanical Properties ◽  
Ceramic Technology ◽  
Raw Material ◽  
Energy Costs ◽  
Additive Technology ◽  
X Ray ◽  
Manufacturing Time

Today 3D printing with ceramics is a promising direction in the development of additive technologies. In this work, we have developed a technology for printing with ceramic pastes based on aluminum oxide and wax, namely: an extruder for printing with ceramic pastes was modeled and manufactured, the composition of the slip was selected and the paste for printing was made. After choosing the print parameters, test samples were printed: a disk and a box. Since 3D printing with ceramics is just one of the stages of manufacturing ceramic products, then we selected the parameters for drying and sintering the raw material. Drying of products is necessary to burn off an excess amount of a binder (paraffin), and due to sintering; the raw material acquires final strength and mechanical characteristics. After sintering, the sintering parameters and physical and mechanical properties of the products were measured. The microstructure of the printed products was studied using scanning electron microscopy. The phase change during sintering was studied by X-ray analysis. All obtained properties were compared with a reference sample (corundum tile made of aluminum oxide of the same grade, but using traditional ceramic technology, including pressing, drying and sintering of the product). In terms of all properties, the printed ceramics are not significantly inferior to the reference sample; however, in general, the additive technology has more advantages, such as a wide variety of shapes, shorter manufacturing time for parts, and lower energy costs.

X-Ray Fluorescence Analysis of Nonhomogeneous Materials by Δμ-Correction Method

1991 ◽  
Vol 35 (B) ◽  
pp. 749-754
Author(s):  
V. I. Karmanov ◽  
V. V. Zagorodny
Keyword(s):  
Reference Sample ◽  
Fluorescence Analysis ◽  
Correction Method ◽  
Electrode Coating ◽  
X Ray ◽  
Fundamental Parameters ◽  
Sample Composition ◽  
Combined Use ◽  
Welding Electrode ◽  
Excitation Conditions

AbstractThe fundamental parameters method (FPM) enables one to determine with high accuracy the chemical composition of homogeneous samples, having only one reference sample. However, the reference sample composition should be similar to that of the samples analyzed.The x-ray fluorescence analysis of multicomponent heterogeneous materials (ores, minerals, their mixtures, welding electrode coating mixtures, fluxes, etc.) is made by the Δμ-correction method based on the combined use of the fundamental and empirical correlations maintaining all the advantages of the FPM. Sample composition is calculated on the basis of the element intensities measured in the sample and in the reference specimen and is corrected for the disturbing effect of excitation conditions and heterogeneity as well as the calculated values of one of the fundamental parameters (μ1). At the preliminary stage of calibration, the coefficients are determined using regression and the absolute fundamental expression for the element fluorescence intensity.

scholarly journals Testing the disk-corona interplay in radiatively-efficient broad-line AGN

2019 ◽  
Vol 628 ◽  
pp. A135 ◽  
Author(s):  
R. Arcodia ◽  
A. Merloni ◽  
K. Nandra ◽  
G. Ponti
Keyword(s):  
Accretion Disk ◽  
Reference Sample ◽  
Selection Effect ◽  
Galactic Nuclei ◽  
Theoretical Explanation ◽  
X Rays ◽  
Broad Line ◽  
Coronal Emission ◽  
X Ray ◽  
Intrinsic Scatter

The correlation observed between monochromatic X-ray and UV luminosities in radiatively-efficient active galactic nuclei (AGN) lacks a clear theoretical explanation despite being used for many applications. Such a correlation, with its small intrinsic scatter and its slope that is smaller than unity in log space, represents the compelling evidence that a mechanism regulating the energetic interaction between the accretion disk and the X-ray corona must be in place. This ensures that going from fainter to brighter sources the coronal emission increases less than the disk emission. We discuss here a self-consistently coupled disk-corona model that can identify this regulating mechanism in terms of modified viscosity prescriptions in the accretion disk. The model predicts a lower fraction of accretion power dissipated in the corona for higher accretion states. We then present a quantitative observational test of the model using a reference sample of broad-line AGN and modeling the disk-corona emission for each source in the LX − LUV plane. We used the slope, normalization, and scatter of the observed relation to constrain the parameters of the theoretical model. For non-spinning black holes and static coronae, we find that the accretion prescriptions that match the observed slope of the LX − LUV relation produce X-rays that are too weak with respect to the normalization of the observed relation. Instead, considering moderately-outflowing Comptonizing coronae and/or a more realistic high-spinning black hole population significantly relax the tension between the strength of the observed and modeled X-ray emission, while also predicting very low intrinsic scatter in the LX − LUV relation. In particular, this latter scenario traces a known selection effect of flux-limited samples that preferentially select high-spinning, hence brighter, sources.

scholarly journals Damage threshold of platinum coating used for optics for self-seeding of soft x-ray free electron laser

2015 ◽  
Vol 23 (5) ◽  
pp. 5397 ◽  
Author(s):  
Jacek Krzywinski ◽  
Daniele Cocco ◽  
Stefan Moeller ◽  
Daniel Ratner
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Damage Threshold ◽  
X Ray ◽  
Platinum Coating

A Method to Characterize Residual Stresses Induced by Machining

2016 ◽  
Author(s):  
Mathieu Girinon ◽  
Vincent Robin ◽  
Erwan Jourden ◽  
Frédéric Valiorgue ◽  
Joël Rech ◽  
...  
Keyword(s):  
Residual Stresses ◽  
Elastic Recovery ◽  
Reference Sample ◽  
The Other ◽  
Easy Access ◽  
Strain Gauges ◽  
Stress Profile ◽  
X Ray ◽  
Residual Stress Profile ◽  
Heat Treated

The modeling of residual stresses induced by drilling remains an issue. Indeed, even if some models are under development, their validation is limited by the absence of universal characterization method of residual stresses inside the hole. This paper aims at presenting a procedure to characterize the residual stress profile induced by drilling. The principle is based on the preparation of a reference sample that has been pre-heat treated in order to remove bulk residual stresses without modifying the microstructure. Then the sample is instrumented with strain gauges before being cut in two parts. This enables on one hand to estimate the elastic recovery after the cut and on the other hand to provide an easy access to the investigated surface. Finally a standard X-Ray diffractometer and an electropolishing technique are combined to estimate residual stresses profiles in two directions (circumferential and axial directions). Some numerical analyses are also performed to estimate stress relaxation during thermal treatment and during sample cutting to give a better interpretation of measurements.

A New Approach of Thin-Film X-Ray Diffraction / Scattering Analysis for Ultra-Low-k Dielectrics with Periodic Pore Structures

2002 ◽  
Vol 716 ◽  
Author(s):  
N. Hata ◽  
Y. Oku ◽  
K. Yamada ◽  
T. Kikkawa
Keyword(s):  
Dielectric Constant ◽  
Electron Density ◽  
Specular Reflection ◽  
Reference Sample ◽  
Film Surface ◽  
Coherent Scattering ◽  
X Ray Diffraction ◽  
Diffraction Scattering ◽  
X Ray ◽  
Low Dielectric

AbstractWe propose and demonstrate experimentally a structural characterization technique for ultra-low-dielectric-constant thin films with periodic porous structures [1-3] by employing X-ray diffraction / scattering measurements. The analytical approach that we propose here takes into account specular reflection, incoherent scattering from random distribution of electron density, and coherent scattering from periodically modulated distribution of electron density. From the analysis, inter-pore distances and pore diameters in the directions perpendicular and parallel to the film surface are determined with which the film porosity is calculated. Thus obtained porosity is then used to discuss the film density and dielectric constant in comparison to those of non-porous reference sample.

scholarly journals Resistance of Aluminide Coatings on Austenitic Stainless Steel in a Nitriding Atmosphere

Materials ◽  
2021 ◽  
Vol 15 (1) ◽  
pp. 162
Author(s):  
Karolina Wierzbowska ◽  
Agnieszka Elżbieta Kochmańska ◽  
Paweł Kochmański
Keyword(s):  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Oxidation Process ◽  
Protective Coatings ◽  
Reference Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gas Nitriding ◽  
Aluminide Coatings ◽  
Gas Corrosion

A new slurry cementation method was used to produce silicide-aluminide protective coatings on austenitic stainless steel 1.4541. The slurry cementation processes were carried out at temperatures of 800 and 1000 °C for 2 h with and without an additional oxidation process at a temperature of 1000 °C for 5 min. The microstructure and thickness of the coatings were studied by scanning electron microscopy (SEM). The intention was to produce coatings that would increase the heat resistance of the steel in a nitriding atmosphere. For this reason, the produced coatings were subjected to gas nitriding at a temperature of 550–570 °C in an atmosphere containing from 40 to 60% of ammonia. The nitriding was carried out using four time steps: 16, 51, 124, and 200 h, and microstructural observations using SEM were performed after each step. Analysis of the chemical composition of the aluminide coatings and reference sample was performed using wavelength (WDS) and energy (EDS) dispersive X-ray microanalysis, and phase analysis was carried out using X-ray diffraction (XRD). The resistance of the aluminide coatings in the nitriding atmosphere was found to depend strongly on the phase composition of the coating. The greatest increase in resistance to gas corrosion under nitriding atmosphere conditions was achieved using a manufacturing temperature of 1000 °C.

scholarly journals The CirPAD, a circular 1.4 M hybrid pixel detector dedicated to X-ray diffraction measurements at Synchrotron SOLEIL

2022 ◽  
Vol 29 (1) ◽  
Author(s):  
Kewin Desjardins ◽  
Cristian Mocuta ◽  
Arkadiusz Dawiec ◽  
Solenn Réguer ◽  
Philippe Joly ◽  
...  
Keyword(s):  
Reference Sample ◽  
Photon Counting ◽  
Array Detector ◽  
Pixel Detector ◽  
X Ray Diffraction ◽  
High Count ◽  
X Ray ◽  
Pixel Array ◽  
Diffraction Imaging ◽  
Pixel Array Detector

One of the challenges of all synchrotron facilities is to offer the highest performance detectors for all their specific experiments, in particular for X-ray diffraction imaging and its high throughput data collection. In that context, the DiffAbs beamline, the Detectors and the Design and Engineering groups at Synchrotron SOLEIL, in collaboration with ImXPAD and Cegitek companies, have developed an original and unique detector with a circular shape. This detector is based on the hybrid pixel photon-counting technology and consists of the specific assembly of 20 hybrid pixel array detector (XPAD) modules. This article aims to demonstrate the main characteristics of the CirPAD (for Circular Pixel Array Detector) and its performance – i.e. excellent pixel quality, flat-field correction, high-count-rate performance, etc. Additionally, the powder X-ray diffraction pattern of an LaB6 reference sample is presented and refined. The obtained results demonstrate the high quality of the data recorded from the CirPAD, which allows the proposal of its use to all scientific communities interested in performing experiments at the DiffAbs beamline.

Digital reference images when evaluating the quality of castings from aluminum and magnesium alloys

2021 ◽  
pp. 182-194
Author(s):  
E. I. Kosarina ◽  
A. A. Demidov ◽  
A. V. Smirnov ◽  
P. V. Suvorov
Keyword(s):  
Digital Image ◽  
Reference Sample ◽  
Subjective Assessment ◽  
Flat Panel ◽  
X Ray ◽  
Digital Reference ◽  
Reference Images ◽  
Flat Panel Detectors ◽  
Aluminum And Magnesium Alloys

Reference X-ray images of defects in castings and welded joints have been used for many years in X-ray radiation inspection. With the transition to digital technologies, and the use of flat-panel detectors instead of radiographic film, the problem arose of creating reference digital images. Comparison of the digital image of the reference sample with the digital image of the test object can be carried out using software, which completely or partially excludes the subjective assessment of the operator, makes it possible to view doubtful areas of the image with magnification and without loss of contrast, automatically show the size of the defect, its intensity distribution by volume of the casting. All this makes the control more objective and productive. The reference images in the detector’s memory do not undergo the aging and degradation typical of X-ray images, and there is no need to replicate them.

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