InGaAs/InP SWIR unipolar barrier photodetector structure

Author(s):  
A. Chelny ◽  
Alexander Savchuk ◽  
Oleg I. Rabinovich ◽  
M. Mezhenny ◽  
A. Aluyev ◽  
...  
Keyword(s):  
2021 ◽  
Vol 4 (5) ◽  
pp. 357-363
Author(s):  
Yunfeng Chen ◽  
Yang Wang ◽  
Zhen Wang ◽  
Yue Gu ◽  
Yan Ye ◽  
...  

2011 ◽  
Vol 20 (03) ◽  
pp. 557-564
Author(s):  
G. R. SAVICH ◽  
J. R. PEDRAZZANI ◽  
S. MAIMON ◽  
G. W. WICKS

Tunneling currents and surface leakage currents are both contributors to the overall dark current which limits many semiconductor devices. Surface leakage current is generally controlled by applying a post-epitaxial passivation layer; however, surface passivation is often expensive and ineffective. Band-to-band and trap assisted tunneling currents cannot be controlled through surface passivants, thus an alternative means of control is necessary. Unipolar barriers, when appropriately applied to standard electronic device structures, can reduce the effects of both surface leakage and tunneling currents more easily and cost effectively than other methods, including surface passivation. Unipolar barriers are applied to the p -type region of a conventional, MBE grown, InAs based pn junction structures resulting in a reduction of surface leakage current. Placing the unipolar barrier in the n -type region of the device, has the added benefit of reducing trap assisted tunneling current as well as surface leakage currents. Conventional, InAs pn junctions are shown to exhibit surface leakage current while unipolar barrier photodiodes show no detectable surface currents.


Author(s):  
A. V. Voitsekhovskii ◽  
S. N. Nesmelov ◽  
S. M. Dzyadukh ◽  
S. A. Dvoretsky ◽  
N. N. Mikhailov ◽  
...  

2018 ◽  
Vol 65 (10) ◽  
pp. 4340-4345 ◽  
Author(s):  
Nima Dehdashti Akhavan ◽  
Gilberto Armando Umana-Membreno ◽  
Renjie Gu ◽  
Jarek Antoszewski ◽  
Lorenzo Faraone

2015 ◽  
Author(s):  
David A. Ramirez ◽  
Stephen A. Myers ◽  
Elena Plis ◽  
Yuliya Kuznetsova ◽  
Christian P. Morath ◽  
...  

2019 ◽  
Vol 48 (10) ◽  
pp. 6145-6151 ◽  
Author(s):  
David Z. Ting ◽  
Alexander Soibel ◽  
Arezou Khoshakhlagh ◽  
Sam A. Keo ◽  
Sir B. Rafol ◽  
...  

2014 ◽  
Vol 22 (2) ◽  
Author(s):  
P. Martyniuk ◽  
M. Kopytko ◽  
A. Rogalski

AbstractIn 1959, Lawson and co-workers publication triggered development of variable band gap Hg1−xCdxTe (HgCdTe) alloys providing an unprecedented degree of freedom in infrared detector design. Over the five decades, this material system has successfully fought off major challenges from different material systems, but despite that it has more competitors today than ever before. It is interesting however, that none of these competitors can compete in terms of fundamental properties. They may promise to be more manufacturable, but never to provide higher performance or, with the exception of thermal detectors, to operate at higher temperatures.In the last two decades a several new concepts of photodetectors to improve their performance have been proposed including trapping detectors, barrier detectors, unipolar barrier photodiodes, and multistage detectors. This paper describes the present status of infrared barrier detectors. It is especially addressed to the group of III-V compounds including type-II superlattice materials, although HgCdTe barrier detectors are also included. It seems to be clear that certain of these solutions have merged as a real competitions of HgCdTe photodetectors.


2019 ◽  
Vol 21 (12) ◽  
pp. 726-737
Author(s):  
A.V. Voitsekhovsky ◽  
◽  
N.A. Kulchitsky ◽  
S.N. Nesmelov ◽  
S.M. Dzyadukh ◽  
...  

2015 ◽  
Vol 70 ◽  
pp. 111-114 ◽  
Author(s):  
D.E. Sidor ◽  
G.R. Savich ◽  
X. Du ◽  
G.W. Wicks
Keyword(s):  

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