Simulation of multiple scattering in a medium with an anisotropic scattering pattern

The similarity rules to compare atmospheres with anisotropic and isotropic scattering are reviewed. Omission of a narrow diffraction peak in the scattering pattern is permitted and corresponds to a special application of the similarity rules. It is shown that the extrapolation length for conservative scattering can be found with great precision from a formula involving only ω2 and ω3. An asymptotic expression for high-order scattering in a semi-infinite atmosphere is given and it is shown by some examples that this expression can be used to find by interpolation the terms of any order. Finally, the way in which the contrast between a dark and bright area near the center of the disk of Mars is affected by an overlying haze is computed for isotropic and for anisotropic scattering.

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The Phenomenon of Intensification (by Several Orders of Magnitude) Defects’ Manifestation in the Multiple-Scattering Pattern and Its Dispersive Nature

METALLOFIZIKA I NOVEISHIE TEKHNOLOGII ◽

10.15407/mfint.36.07.0857 ◽

2016 ◽

Vol 36 (7) ◽

pp. 857-870 ◽

Cited By ~ 11

Author(s):

V. V. Lizunov ◽

◽

V. B. Molodkin ◽

S. V. Lizunova ◽

M. G. Tolmachyov ◽

...

Keyword(s):

Multiple Scattering ◽

Scattering Pattern ◽

Dispersive Nature

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of Strains and Defects in Ion-Implanted Garnet Films

METALLOFIZIKA I NOVEISHIE TEKHNOLOGII ◽

10.15407/mfint.37.08.1017 ◽

2016 ◽

Vol 37 (8) ◽

pp. 1017-1026 ◽

Cited By ~ 3

Author(s):

V. B. Molodkin ◽

◽

S. I. Olikhovskii ◽

E. S. Skakunova ◽

E. G. Len ◽

...

Keyword(s):

Multiple Scattering ◽

Mechanical Model ◽

Quantum Mechanical ◽

Scattering Pattern ◽

Quantum Mechanical Model ◽

Garnet Films ◽

Ion Implanted

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A Method for Interpreting Small Angle Neutron Scattering Data from Quasi-Spherical Objects

MRS Proceedings ◽

10.1557/proc-376-499 ◽

1994 ◽

Vol 376 ◽

Cited By ~ 3

Author(s):

T.M. Sabine ◽

W.K. Bertram ◽

L.P. Aldridge

Keyword(s):

Neutron Scattering ◽

Multiple Scattering ◽

Small Angle ◽

Small Angle Neutron Scattering ◽

Small Angle Scattering ◽

Scattering Data ◽

Type Function ◽

Scattering Pattern ◽

Angle Scattering

ABSTRACTSmall angle scattering data are traditionally interpreted in terms of scattering patterns at the Porod and the Guinier limits. It is difficult to fit the entire scattering pattern to account for scattering from spheres because Rayleigh's formula contains oscillatory terms which are smeared out in practice by perturbations in the sizes of the scattering agents.It is proposed that a Lorenztian type function be used instead of Rayleigh's function. By using this equation it is possible to fit the entire small angle scattering pattern and obtain the correct forms of the Guinier and Porod limits.The effects of correlation and multiple scattering are also explored.

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GENERALIZED CHOU-YANG MODEL AND MESON-PROTON ELASTIC SCATTERING AT HIGH ENERGIES

International Journal of Modern Physics A ◽

10.1142/s0217751x89000698 ◽

1989 ◽

Vol 04 (07) ◽

pp. 1747-1754 ◽

Cited By ~ 1

Author(s):

MOHAMMAD SALEEM ◽

FAZAL-E ALEEM ◽

HARIS RASHID

Keyword(s):

Experimental Data ◽

Form Factor ◽

Elastic Scattering ◽

Multiple Scattering ◽

Scattering Theory ◽

Anisotropic Scattering ◽

Proton Form Factor ◽

Recent Experimental Data ◽

High Energies ◽

Proton Elastic Scattering

The various characteristics of meson-proton elastic scattering at high energies are explained by using the generalized Chou-Yang model which takes into consideration the anisotropic scattering of objects constituting pions(kaons) and protons. A new parametrization of the proton form factor consistent with the recent experimental data is proposed. It is then shown that all the data for meson-proton elastic scattering at 200 and 250 GeV/c are in agreement with theoretical computations. The physical picture of generalized Chou-Yang model which is based on multiple scattering theory is given in detail.

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Analysis of STEM micrographs of thick objects

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100081395 ◽

1978 ◽

Vol 36 (2) ◽

pp. 106-107

Author(s):

S. Golladay

Keyword(s):

Inelastic Scattering ◽

Multiple Scattering ◽

Mass Distribution ◽

Cross Sections ◽

Phase Contrast ◽

Image Point ◽

Contrast Effects ◽

Total Cross Sections ◽

Elastic And Inelastic Scattering

The theory of multiple scattering has been worked out by Groves and comparisons have been made between predicted and observed signals for thick specimens observed in a STEM under conditions where phase contrast effects are unimportant. Independent measurements of the collection efficiencies of the two STEM detectors, calculations of the ratio σe/σi = R, where σe, σi are the total cross sections for elastic and inelastic scattering respectively, and a model of the unknown mass distribution are needed for these comparisons. In this paper an extension of this work will be described which allows the determination of the required efficiencies, R, and the unknown mass distribution from the data without additional measurements or models. Essential to the analysis is the fact that in a STEM two or more signal measurements can be made simultaneously at each image point.

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Background Fitting in the Low-Loss Region of Electron Energy Loss Spectra

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133874 ◽

1990 ◽

Vol 48 (2) ◽

pp. 56-57

Author(s):

C P Scott ◽

A J Craven ◽

C J Gilmore ◽

A W Bowen

Keyword(s):

Energy Loss ◽

Multiple Scattering ◽

Simple Form ◽

Single Scattering ◽

Low Loss ◽

Characteristic Energy ◽

Normal Method ◽

Fitting In ◽

Electron Energy Loss ◽

Electron Energy Loss Spectra

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.

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