Defects with bright contrast in the induced-current mode in GaN-based light-emitting structures

2007 ◽  
Vol 1 (4) ◽  
pp. 394-397 ◽  
Author(s):  
S. A. Bel’nik ◽  
P. S. Vergeles ◽  
N. M. Shmidt ◽  
E. B. Yakimov
Keyword(s):  
Current Mode ◽  
Induced Current ◽  
Light Emitting ◽  
Bright Contrast

scholarly journals Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes

2006 ◽  
Vol 12 (S02) ◽  
pp. 1514-1515 ◽  
Author(s):  
CM Parish ◽  
CL Progl ◽  
ME Salmon ◽  
PE Russell
Keyword(s):  
Electron Beam ◽  
Structural Analysis ◽  
Light Emitting Diodes ◽  
Induced Current ◽  
Light Emitting ◽  
Electron Beam Induced Current ◽  
Cathodoluminescence Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

scholarly journals Bound-exciton-induced current bistability in a silicon light-emitting diode

2003 ◽  
Vol 82 (17) ◽  
pp. 2823-2825 ◽  
Author(s):  
J. M. Sun ◽  
T. Dekorsy ◽  
W. Skorupa ◽  
B. Schmidt ◽  
M. Helm
Keyword(s):  
Light Emitting Diode ◽  
Induced Current ◽  
Light Emitting

scholarly journals Two-photon optical-beam-induced current imaging of indium gallium nitride blue light-emitting diodes

1999 ◽  
Vol 24 (20) ◽  
pp. 1407 ◽  
Author(s):  
Fu-Jen Kao ◽  
Mao-Kuo Huang ◽  
Yung-Shun Wang ◽  
Sheng-Lung Huang ◽  
Ming-Kwei Lee ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Blue Light ◽  
Indium Gallium Nitride ◽  
Light Emitting Diodes ◽  
Optical Beam ◽  
Induced Current ◽  
Light Emitting ◽  
Two Photon ◽  
Indium Gallium ◽  
Optical Beam Induced Current
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