Atomic Force Microscopy Measurement of the Resistivity of Semiconductors

2018 ◽  
Vol 63 (8) ◽  
pp. 1236-1241 ◽  
Author(s):  
V. A. Smirnov ◽  
R. V. Tominov ◽  
N. I. Alyab’eva ◽  
M. V. Il’ina ◽  
V. V. Polyakova ◽  
...  
Langmuir ◽  
2008 ◽  
Vol 24 (9) ◽  
pp. 4944-4951 ◽  
Author(s):  
Loredana S. Dorobantu ◽  
Subir Bhattacharjee ◽  
Julia M. Foght ◽  
Murray R. Gray

2010 ◽  
Vol 35 (24) ◽  
pp. 4193 ◽  
Author(s):  
Banyat Lekprasert ◽  
Victoria Sedman ◽  
Clive J. Roberts ◽  
Saul J. B. Tedler ◽  
Ioan Notingher

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