A time-of-flight mass reflectron with controlled ion-energy spread in the packet generated by an ion source

2014 ◽  
Vol 40 (2) ◽  
pp. 108-111 ◽  
Author(s):  
S. B. Bimurzaev
1997 ◽  
Vol 68 (3) ◽  
pp. 1398-1402 ◽  
Author(s):  
Y. Lee ◽  
R. A. Gough ◽  
W. B. Kunkel ◽  
K. N. Leung ◽  
L. T. Perkins ◽  
...  

2010 ◽  
Vol 28 (3) ◽  
pp. 429-436 ◽  
Author(s):  
J.P. Xin ◽  
X.P. Zhu ◽  
M.K. Lei

AbstractEnergy deposition by high-intensity pulsed ion beam into a metal target has been studied with time-of-flight (TOF) of ions which can be related to the original ion kinetic energy E0 and the ion mass with $t_{\rm TOF} \propto 1/\sqrt{2E_{0}/m_{i}}$. It is found that the TOF effect has a profound influence on the kinetic energy distribution of implanted ions and subsequent energy deposition process into the target. The HIPIB of mixed H+ and C+ was extracted from a magnetically insulated ion diode at a peak accelerating voltage of 350 kV, leading to an ion current density of 300 A/cm2 at the target. The widespread ion energy spectrum remarkably varied in shape as arriving at the target surface, from the original Gaussian-like of 80-ns duration to a pulse form of a sharp front and a long tail extending to about 140-ns duration. Energy loss of the mixed ions into a Ti target was simulated utilizing a Monte Carlo method. The energy deposition generally showed a shallowing trend and could be divided into two phases proceeded with sequent arrivals of H+ and C+. Note that, the peak value of deposited energy profile appeared at the beginning of mixed ion irradiation phase, other than the phase of firstly arrived H+ with peak kinetic energy and peak ion current. This study indicated that TOF effect of ions greatly affects the HIPIB-matter interaction with a kinetic energy spectrum of impinging ions at the target, noticeably differing from that of original output of the ion source; consequently, the specific energy deposition phenomena of the widespread ion energy can be studied with the TOF correlation of ion energy and ion current, otherwise not obtainable in common cases assuming fixed ion energy distribution in accordance with the original source output.


1989 ◽  
Vol 60 (3) ◽  
pp. 358-362 ◽  
Author(s):  
D. R. Whaley ◽  
T. P. Goodman ◽  
W. D. Getty

2021 ◽  
Vol 928 ◽  
Author(s):  
S.W. Miller ◽  
J.R. Ulibarri-Sanchez ◽  
B.D. Prince ◽  
R.J. Bemish

Orthogonal time-of-flight mass spectrometry has been used to characterize the kinetic energy and charged species distributions from an in vacuo electrospray ion source for four different ionic liquids at volumetric flow rates between 0.3 and 3.3 nanolitres per second. In all cases, the mass spectra revealed charged species consisting of singly charged and multiply charged ions as well as two broad, unresolved droplet distributions occurring in the 104 to 106 atomic mass unit per charge range. The mean jet velocity and mean jet breakup potential were established from analysis of the energy profile of the high mass-to-charge droplets. At the jet breakup point, we find the energy loss and the jet diameter flow rate dependence of the electrospray beam to be similar to that determined by Gamero-Castaño (Phys. Fluids, vol. 20, 2008, 032103; Phys. Rev. Fluids, vol. 8, 2021, 013701) for 1-ethyl-3-methylimidazolium bis(trifluromethylsulfonyl)imide at similar volumetric flow rates. Similar trends are observed for all four liquids over the flow regime. A jet instability analysis revealed that jet electrification and viscous effects drive the jet breakup from the case of an uncharged, inviscid jet; jet breakup occurs at droplet and jet radius ratios that deviate from 1.89. Using the analytically determined ratio and the beam profile, different species are modelled to reconstruct the mass spectra; primary droplets constitute only a fraction of the total species present. The populations of the species are discussed.


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