Adaptation of the Gelius intensity model in semiempirical HAM/3 molecular orbital calculations of valence photoelectron spectra excited by X-ray radiation
Keyword(s):
X Ray
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The Gelius intensity model has been adapted in the semiempirical HAM/3 method to calculate the valence ionization energies and intensities in XPS. Both semiempirical and àb initio Hartree–Fock–Slater atomic photoionization cross-sections can be used. Results presented for C2H2, C2H4, N2, H2O, CH3OH, and CH2F2 demonstrate that the present method can facilitate the interpretation of experimental XPS.
1981 ◽
Vol 36
(11)
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pp. 1246-1252
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1977 ◽
Vol 42
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pp. 85-101
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1987 ◽
Vol 109
(23)
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pp. 7025-7031
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1988 ◽
Vol 84
(2)
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pp. 209
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1975 ◽
Vol 6
(5)
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pp. 429-450
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1999 ◽
Vol 54
(2)
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pp. 193-199
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