CANONICAL SURFACE REACTION PROCESSES ACTIVATED BY ELECTRONIC FRICTION

Author(s):  
D. M. NEWNS ◽  
T. F. HEINZ ◽  
J. A. MISEWICH ◽  
MADS BRANDBYGE ◽  
PER HEDEGARD
2019 ◽  
Vol 123 (40) ◽  
pp. 8717-8725 ◽  
Author(s):  
Yixiao Wang ◽  
M. Ross Kunz ◽  
Denis Constales ◽  
Gregory Yablonsky ◽  
Rebecca Fushimi

2000 ◽  
Vol 374 (2) ◽  
pp. 243-248 ◽  
Author(s):  
Hideki Motomura ◽  
Shin-ichi Imai ◽  
Kunihide Tachibana

Hyomen Kagaku ◽  
1992 ◽  
Vol 13 (6) ◽  
pp. 358-364
Author(s):  
Kohei KAWAMURA ◽  
Shuichi ISHIZUKA ◽  
Hiroyuki SAKAUE ◽  
Yasuhiro HORIIKE

1998 ◽  
Vol 507 ◽  
Author(s):  
Shyam Ramalingam ◽  
Dimitrios Maroudas ◽  
Eray S. Aydil

ABSTRACTWe present a systematic atomic-scale analysis of the interactions of SiH3radicals originating in silane containing discharges with Si(001)-(2×1) and H-terminated Si(001)-(2×1) surfaces. Through simulations, we show that the hydrogen coverage of the surface is the key factor that controls both the surface reaction mechanism and the reaction probability. The SiH3radical reacts readily with the pristine Si(001)-(2×1) surface during the initial stages of growth while its reactivity with the corresponding H-terminated surface is considerably lower. Deposition of a-Si:H from SiH3 radicals has also been simulated by repeatedly impinging SiH3 radicals onto Si(001)-(2×1) surfaces maintained at 500 °C. During deposition under these conditions, the dominant mechanism of hydrogen removal from the surface is through abstraction by SiH3 radicals, which subsequently return to the gas phase as silane. The important reaction processes that take place during film growth have been identified and their energetics has been analyzed.


2001 ◽  
Vol 390 (1-2) ◽  
pp. 134-138 ◽  
Author(s):  
Hideki Motomura ◽  
Shin-ichi Imai ◽  
Kunihide Tachibana

1993 ◽  
Author(s):  
R. J. D. Miller ◽  
L. A. Gomez-Jahn ◽  
Raymond J. Lanzafame ◽  
L. Min ◽  
Stephen P. Palese

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