RECENT DEVELOPMENTS IN THE AIR PARTICULATE RESEARCH CAPABILITY AT THE NEW ZEALAND ION BEAM ANALYSIS FACILITY

2012 ◽  
Vol 22 (01n02) ◽  
pp. 121-130 ◽  
Author(s):  
B. BARRY ◽  
W. J. TROMPETTER ◽  
P. K. DAVY ◽  
A. MARKWITZ
Keyword(s):  
New Zealand ◽  
Elemental Analysis ◽  
Analytical Methods ◽  
Ion Beam ◽  
Sampling System ◽  
Great Flexibility ◽  
Ion Beam Analysis ◽  
Air Particulate ◽  
Beam Analysis ◽  
Recent Developments

The New Zealand capability in Ion Beam Analysis of air particulate samples has been upgraded in recent years. The main equipment change has been the introduction of the ability to analyse samples taken using the Streaker (PIXE International Corporation) sampling system. This is an automated sampler which allows for great flexibility in monitoring programmes by collecting particulates for up to about 70 sampling periods which can range in collection times from seconds to many hours. The IBA analysis for hydrogen on standard filters and for PIXE multi-elemental analysis of the Streaker filters has also been studied with a view to optimising analytical methods.

AIR PARTICULATE RESEARCH CAPABILITY AT THE NEW ZEALAND ION BEAM ANALYSIS FACILITY USING PIXE AND IBA TECHNIQUES

2005 ◽  
Vol 15 (03n04) ◽  
pp. 249-255 ◽  
Author(s):  
W. J. TROMPETTER ◽  
A. MARKWITZ ◽  
P. DAVY
Keyword(s):  
Particulate Matter ◽  
New Zealand ◽  
Limit Of Detection ◽  
Ion Beam ◽  
Anthropogenic Sources ◽  
Ion Beam Analysis ◽  
Air Particulate Matter ◽  
X Ray ◽  
Air Particulate ◽  
Beam Analysis

PIXE and Ion Beam Analysis are one of the few techniques that can be used to identify the elemental composition of air particulates without destroying the filter sample. They are key tools for identifying the sources and determining the relative contribution of biogenic and anthropogenic sources of air particulate matter pollution in our environment. Over the last 8 years, specialised equipment has been designed and built at the New Zealand Ion Beam Analysis facility in Lower Hutt for semi automated analysis of air filters. The equipment and experimental techniques have been refined to improve sensitivities for many of the elements in the periodic table. At GNS, sensitivities have recently been further improved by using two X-ray detectors simultaneously with different amounts of X-ray filtering and collimation. The average limit of detection is improved from 66 ng/cm2 (typical for a setup using a single detector) to 35 ng/cm2 using two detectors simultaneously. The New Zealand Ion Beam Analysis facility now routinely analyses air particulate matter collected on filters from several locations around New Zealand. In this paper, results of air particulate studies from several locations in the Wellington region are presented.

scholarly journals Integrating Non-Destructive Ion Beam Analysis Methods and AMS Radiocarbon Dating for the Study of Ancient Bronze Statues

Radiocarbon ◽  
2012 ◽  
Vol 54 (3-4) ◽  
pp. 801-812 ◽  
Author(s):  
Gianluca Quarta ◽  
Lucio Calcagnile ◽  
Massimo Vidale
Keyword(s):  
Analytical Methods ◽  
Gamma Ray ◽  
Ion Beam ◽  
Compositional Analysis ◽  
Particle Accelerators ◽  
Accelerator Facility ◽  
Ion Beam Analysis ◽  
Ams Radiocarbon Dating ◽  
Beam Analysis ◽  
Wide Range

Analytical methods based on particle accelerators are widely used in cultural heritage diagnostics and archaeological sciences from the absolute dating of organic materials by means of radiocarbon accelerator mass spectrometry (AMS) to the analysis of the elemental composition of a wide range of materials (metals, obsidians, pottery) via ion beam analysis (IBA) techniques. At CEDAD (Centre for Dating and Diagnostics), the accelerator facility of the University of Salento, AMS 14C dating and PIXE (particle-induced X-ray emission)-PIGE (particle-induced gamma-ray emission) compositional analysis in external beam mode are combined to study certain archaeological materials. We present a review of the combined application of these analytical methods in the study of casting cores of the Riace bronzes, 2 classical Greek statues of extraordinary importance for the history of art.

ELEMENTAL ANALYSIS AND SOURCE APPORTIONMENT OF AMBIENT PARTICULATE MATTER AT MASTERTON, NEW ZEALAND

2005 ◽  
Vol 15 (03n04) ◽  
pp. 225-231 ◽  
Author(s):  
P. DAVY ◽  
W. J. TROMPETTER ◽  
A. MARKWITZ ◽  
D. C. WEATHERBURN
Keyword(s):  
Particulate Matter ◽  
New Zealand ◽  
Elemental Composition ◽  
Ion Beam ◽  
Airborne Particulate Matter ◽  
Gravimetric Analysis ◽  
Air Particulate Matter ◽  
Air Particulate ◽  
Beam Analysis ◽  
Light Reflectance

At certain locations in the Wellington Region, pollution episodes due to air particulate matter are known to occur from time to time. Traditional gravimetric analysis of airborne particulate matter is unable to provide information on the sources contributing to air particulate concentrations. Ion Beam Analysis (IBA) is one of the few non-destructive techniques that can be used to identify the elemental composition of air particulate matter on a filter sample. In this work IBA was used to characterise air particulate matter in two size fractions, PM 20. and PM 10-2.0, collected at a monitoring station in Masterton, New Zealand. Elements with atomic mass above neon were measured by the PIXE technique. Elemental carbon was measured with a light reflectance device. Elemental 'fingerprints' of contributing sources were determined by performing factor analysis of the elemental composition. The results indicate that 'Sea Salt' and 'Soil' sources are major contributors to the coarse ( PM 10-2.0) fraction and 'Combustion' sources dominate the fine ( PM 2.0) fraction of air particulate matter. Analysis of seasonal differences was a useful tool in elucidating source profiles.

scholarly journals Evaluation of the sub-surface morphology and composition of gunshot residue using focussed ion beam analysis

2019 ◽  
Vol 297 ◽  
pp. 100-110 ◽  
Author(s):  
Nick Lucas ◽  
Kelsey E. Seyfang ◽  
Andrew Plummer ◽  
Michael Cook ◽  
K. Paul Kirkbride ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Ion Beam ◽  
Gunshot Residue ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Focussed Ion Beam

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

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