A REVIEW OF PARTICLE-INDUCED X-RAY EMISSION IN GEOLOGY
1991 ◽
Vol 01
(04)
◽
pp. 311-338
◽
Particle-induced X-ray emission is very well suited for the analysis of geological samples. This review discusses the characteristics for such analyses. For light-element analysis, the complimentary technique of particle-induced gamma ray emission is also discussed since the emission of gamma rays occurs simultaneously with the X-rays. Not only are exploratory investigations of PIXE's capabilities presented but also synopses of studies aimed at answering geological questions. The latter have become more and more common in the last few years, an indication of PIXE's maturity as a technique for clement analysis of geological material.