ENTROPIC AND MULTIFRACTAL ANALYSIS OF DISORDERED MORPHOLOGIES

Fractals ◽  
1993 ◽  
Vol 01 (03) ◽  
pp. 671-679 ◽  
Author(s):  
A. BEGHDADI ◽  
C. ANDRAUD ◽  
J. LAFAIT ◽  
J. PEIRO ◽  
M. PERREAU

We propose the configuration entropy as an efficient tool of characterization of the disorder of random morphologies and as a pertinent morphological parameter for describing the optical properties. When increasing the size of observation of an image, it undergoes a maximum at a characteristic length which is the optimum length at which the image must be observed to get the maximum information. When applied to computer simulated images, the configuration entropy is more powerful, less ambiguous and less sensitive to the finite size of images than the generalized fractal dimension.

Author(s):  
Margaret L. Sattler ◽  
Michael A. O'Keefe

Multilayered materials have been fabricated with such high perfection that individual layers having two atoms deep are possible. Characterization of the interfaces between these multilayers is achieved by high resolution electron microscopy and Figure 1a shows the cross-section of one type of multilayer. The production of such an image with atomically smooth interfaces depends upon certain factors which are not always reliable. For example, diffusion at the interface may produce complex interlayers which are important to the properties of the multilayers but which are difficult to observe. Similarly, anomalous conditions of imaging or of fabrication may occur which produce images having similar traits as the diffusion case above, e.g., imaging on a tilted/bent multilayer sample (Figure 1b) or deposition upon an unaligned substrate (Figure 1c). It is the purpose of this study to simulate the image of the perfect multilayer interface and to compare with simulated images having these anomalies.


2015 ◽  
Vol 31 (1) ◽  
pp. 313-348 ◽  
Author(s):  
Patrice Abry ◽  
Marianne Clausel ◽  
Stéphane Jaffard ◽  
Stéphane Roux ◽  
Béatrice Vedel

1992 ◽  
Vol 34 (2) ◽  
pp. 209-214
Author(s):  
Daniel Ševčovič

The present note deals with bounded endomorphisms of free p-algebras (pseudocomplemented lattices). The idea of bounded homomorphisms was introduced by R. McKenzie in [8]. T. Katriňák [5] subsequently studied the properties of bounded homomorphisms for the varieties of p-algebras. This concept is also an efficient tool for the characterization of, so-called, splitting as well as projective algebras in the varieties of all lattices or p-algebras. For details the reader is referred to [2], [5], [6], [7] and other references therein. Let us emphasize that the main results that are contained in the above mentioned references strongly depend on the boundedness of each endomorphism of any finitely generated free algebra in a given variety.


Parasitology ◽  
2009 ◽  
Vol 137 (1) ◽  
pp. 1-11 ◽  
Author(s):  
C. SU ◽  
E. K. SHWAB ◽  
P. ZHOU ◽  
X. Q. ZHU ◽  
J. P. DUBEY

SUMMARYThe development of simple, sensitive and rapid methods for the detection and identification ofToxoplasma gondiiis important for the diagnosis and epidemiological studies of the zoonotic disease toxoplasmosis. In the past 2 decades, molecular methods based on a variety of genetic markers have been developed, each with its advantages and limitations. The application of these methods has generated invaluable information to enhance our understanding of the epidemiology, population genetics and phylogeny ofT. gondii. However, since most studies focused solely on the detection but not genetic characterization ofT. gondii, the information obtained was limited. In this review, we discuss some widely used molecular methods and propose an integrated approach for the detection and identification ofT. gondii, in order to generate maximum information for epidemiological, population and phylogenetic studies of this key pathogen.


2011 ◽  
Vol 1288 ◽  
Author(s):  
G. Rosas ◽  
J. Chihuaque ◽  
C. Patiño-Carachure ◽  
R. Esparza ◽  
R. Pérez

ABSTRACTWell-crystallized AlN nanorods have been produced by mechanical milling and subsequent annealing treatment of the milling powders (mechanothermal process). High purity AlN powders were used as the starting material. Mechanical milling was carried out in a vibratory SPEX mill for 30 h, using vials and balls of silicon nitride. The annealing treatment was carried out at 1200 ºC for 10 min. The characterization of the samples was performed by X-ray diffractometry and transmission electron microscopy (TEM). TEM observations indicated that the synthesized nanorods consisted of 30 nm in diameter and 100 nm in length. High resolution electron microscopy observations have been used in the structural characterization. AlN nanorods exhibit a well-crystallized structure. The growing direction of the nanorods is close to the [001] direction. The structural configurations have been explored through comparisons between experimental HREM images and theoretically simulated images obtained with the multislice method of the dynamical theory of electron diffraction.


2002 ◽  
Vol 14 (9) ◽  
pp. 2347-2352 ◽  
Author(s):  
Pham Ngoc Khue ◽  
Olaf Huseby ◽  
Antoine Saucier ◽  
Jiri Muller

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