A RAY TRACING METHOD TO DESCRIBE THE ANGULAR PROFILES OF DIFFRACTION RODS IN SURFACE X RAY EXPERIMENTS

1997 ◽  
Vol 04 (05) ◽  
pp. 1035-1038 ◽  
Author(s):  
X. TORRELLES ◽  
J. ALVAREZ ◽  
S. FERRER

The accurate determination of the coordinates normal to the surface in X ray diffraction experiments requires measuring up to high exit angles. Under these conditions some instrumental and geometrical effects related to the dimensions of the detector slits and the location in the Ewald sphere of the outgoing beam may complicate the analysis of the data. We have developed a method based on the ray tracing technique to investigate the appropriate corrections. Examples for Ge(001)-(2×1) are presented.

2020 ◽  
Vol 105 (3) ◽  
pp. 353-362
Author(s):  
Katarzyna Luberda-Durnaś ◽  
Marek Szczerba ◽  
Małgorzata Lempart ◽  
Zuzanna Ciesielska ◽  
Arkadiusz Derkowski

Abstract The primary aim of this study was the accurate determination of unit-cell parameters and description of disorder in chlorites with semi-random stacking using common X-ray diffraction (XRD) data for bulk powder samples. In the case of ordered chlorite structures, comprehensive crystallographic information can be obtained based on powder XRD data. Problems arise for samples with semi-random stacking, where due to strong broadening of hkl peaks with k ≠ 3n, the determination of unit-cell parameters is demanding. In this study a complete set of information about the stacking sequences in chlorite structures was determined based on XRD pattern simulation, which included determining a fraction of layers shifted by ±1/3b, interstratification with different polytypes and 2:1 layer rotations. A carefully selected series of pure Mg-Fe tri-trioctahedral chlorites with iron content in the range from 0.1 to 3.9 atoms per half formula unit cell was used in the study. In addition, powder XRD patterns were carefully investigated for the broadening of the odd-number basal reflections to determine interstratification of 14 and 7 Å layers. These type of interstratifications were finally not found in any of the samples. This result was also confirmed by the XRD pattern simulations, assuming interstratification with R0 ordering. Based on h0l XRD reflections, all the studied chlorites were found to be the IIbb polytype with a monoclinic-shaped unit cell (β ≈ 97°). For three samples, the hkl reflections with k ≠ 3n were partially resolvable; therefore, a conventional indexing procedure was applied. Two of the chlorites were found to have a monoclinic cell (with α, γ = 90°). Nevertheless, among all the samples, the more general triclinic (pseudomonoclinic) crystal system with symmetry C1 was assumed, to calculate unit-cell parameters using Le Bail fitting. A detailed study of semi-random stacking sequences shows that simple consideration of the proportion of IIb-2 and IIb-4/6 polytypes, assuming equal content of IIb-4 and IIb-6, is not sufficient to fully model the stacking structure in chlorites. Several, more general, possible models were therefore considered. In the first approach, a parameter describing a shift into one of the ±1/3b directions (thus, the proportion of IIb-4 and IIb-6 polytypes) was refined. In the second approach, for samples with slightly distinguishable hkl reflections with k ≠ 3n, some kind of segregation of individual polytypes (IIb-2/4/6) was considered. In the third approach, a model with rotations of 2:1 layers about 0°, 120°, 240° was shown to have the lowest number of parameters to be optimized and therefore give the most reliable fits. In all of the studied samples, interstratification of different polytypes was revealed with the fraction of polytypes being different than IIbb ranging from 5 to 19%, as confirmed by fitting of h0l XRD reflections.


1998 ◽  
Vol 524 ◽  
Author(s):  
X. R. Huang ◽  
M. Dudley ◽  
W. M. Vetter ◽  
W. Huang ◽  
S. Wang ◽  
...  

ABSTRACTThe topographic contrast of superscrew dislocations in 6H-SiC crystals has been studied by synchrotron white-beam x-ray topography in the Bragg reflection geometry. The diffraction images of these dislocations are simulated using a ray-tracing method. Systematical simulations, which coincide with the dislocation images taken by back-and grazing-reflection topography, clearly reveal the kinematic diffraction mechanisms of the superscrew dislocation, and illustrate that synchrotron reflection topography is capable of providing accurate descriptions of the strain fields, the Burgers vector magnitudes, and the senses of these dislocations. In addition, our experiments and simulations demonstrate straightforwardly the relation between the topographic contrast and the lattice distortions, and therefore the general mechanisms underlying contrast formation of defect images in synchrotron reflection topographs are provided.


1990 ◽  
Vol 188 ◽  
Author(s):  
Paul A. Flinn

ABSTRACTAlthough wafer curvature measurement provides a rapid and accurate determination of stress in a uniform thin film, the technique is not applicable to patterned films. To study the stress in metal lines, and the effect of passivation on that stress, it is necessary to use X-ray diffraction. To obtain the sensitivity and precision required, a generalized focusing diffractometer (GFD), that had been developed especially for work on thin films, was used in this study.The elastic strain tensors for aluminum and aluminum-silicon films and patterned lines were determined by X-ray diffraction. The corresponding stress tensors were calculated with the use of the known elastic constants of aluminum. The effect of various oxide and oxynitride passivations was investigated. Passivation over uniform metal films has very little effect, while passivation over patterned metal results in substantial triaxial tensile stress in the metal. Contrary to the conventional wisdom, high compressive stress in the passivation does not result in additional tensile stress in the metal. A possible explanation for the frequently observed deleterious effect (increased tendency for formation of cracks and voids) of highly compressive silicon nitride and silicon oxynitride passivations will be discussed.


2002 ◽  
Vol 35 (6) ◽  
pp. 689-695 ◽  
Author(s):  
W. M. Vetter ◽  
M. Dudley

Micropipe images appeared in synchrotron white-beam X-ray topographs of thin basal-cut SiC wafers taken using prismatic reflections whereg · b= 0. They consisted of white ovals inclined along the direction of the topographs'gvector that were terminated with dark spikes at either end. The thin wafers tended to curl; the appearance of a defect's image varied depending on the sign of the curvature relative to the side serving as the diffracted beam's exit surface. The micropipe images were computer simulated using the ray-tracing method. The calculation assumed that they arose from the surface-relaxation strain component of a closed-core screw dislocation perpendicular to the surface of a thin foil. The qualitative features of the micropipe images were reproduced in their simulations, but the magnitude of the lattice misorientations predicted by the model was not large enough to account for the size of the experimentally observed dislocation images.


2010 ◽  
Vol 44 (1) ◽  
pp. 184-192 ◽  
Author(s):  
Carlos Driemeier ◽  
Guilherme A. Calligaris

This work defines the crystallinity of cellulose I materials on a dry-weight basis. Theoretical and experimental developments in X-ray diffraction lead to a crystallinity determination method that is estimated to reach 1σ accuracies of better than 0.05 (crystallinity defined between 0 and 1). The method is based on Rietveld modelling, to resolve cellulose I Bragg peaks, and a standard truncated invariant integral. Corrections are derived to account for incoherent scattering, moisture content and other compositional deviations from pure cellulose. The experimental development uses X-ray diffraction in transmission fibre geometry with two-dimensional pattern Rietveld modelling, including a crystal-orientation distribution function. The crystallinities of a few commercial cellulose I materials were determined with the aim of illustrating the applicability of the method.


1993 ◽  
Vol 132 (3-4) ◽  
pp. 427-434 ◽  
Author(s):  
C. Bocchi ◽  
C. Ferrari ◽  
P. Franzosi ◽  
A. Bosacchi ◽  
S. Franchi

2014 ◽  
Vol 70 (a1) ◽  
pp. C284-C284 ◽  
Author(s):  
Alessandro Genoni

The accurate determination of electron densities in crystals from high-resolution X-ray diffraction data has become more and more important over the years. The existing techniques to accomplish this task can be subdivided into two great families: the multipole models and the wave function-based strategies. The former, which are the most widely used, are essentially linear scaling and allow an easy chemical interpretation of the obtained molecular charge densities, but they are also characterized by some drawbacks, such as the possible presence of unphysical negative regions in the resulting electron distributions. On the contrary, the latter always provide quantum mechanically rigorous electron densities, but they are more computationally expensive and, above all, the ease of chemical interpretation is almost completely lost. In this context, in order to combine the easy chemical interpretability of the multipole models with the quantum mechanical rigor of the wave-function based methods, we have recently extended the X-ray constrained wave function approach proposed by Jayatilaka in the framework of a quantum chemistry technique for the a priori determination of Extremely Localized Molecular Orbitals (ELMOs), namely we have developed a new strategy that allows to extract from X-ray diffraction data a single Slater determinant built up wit Molecular Orbitals strictly localized on small molecular fragments (e.g., atoms, bonds or functional groups). Preliminary tests have shown that the determination of X-ray constrained ELMOs is really straightforward. Furthermore, given the reliable transferability of the obtained Molecular Orbitals, we are constructing new ELMOs databases that can be used as alternative to the existing pseudo-atoms libraries for refining crystallographic structures and electron distributions of large systems. A detailed comparison between the new technique and the multipole models is also currently under investigation.


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