Enhanced pyroelectric properties of PZT/PVDF-TrFE composites using calcined PZT ceramic powders

The effects of calcined lead–zirconate–titanate (PZT) powders on the electric properties of PZT/polyvinylidene-trifluorethylene copolymer (PVDF-TrFE) composites thick films were studied in this paper. Firstly, the PZT powders synthesized by hydrothermal method were calcined at different temperatures ranging from 300°C to 900°C, and then the PZT/PVDF-TrFE composites films were produced by casting PZT/PVDF-TrFE suspension onto the indium-tin-oxide (ITO)-coated glass substrates. Electric properties, including dielectric and pyroelectric performances of thick films consisting of PZT powders calcined at different temperatures were tested. The highest pyroelectric coefficient obtained in the sample using 700°C calcined PZT powders was 96 μCm-2K-1, which was 20% higher than the composites made of uncalcined powders. Additionally, the highest detectivity figure-of-merit (FOM) (F D ) of the composite was 1.36 × 10-5Pa-1/2, which increased about 13.5% compared to the one using uncalcined powders.

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Influence of Grain-Growth Inhibiting Dopants on the Electrophysical Properties of Rhombohedral Pyroelectric Lead Zirconate-Titanate Ceramics

MRS Proceedings ◽

10.1557/proc-243-317 ◽

1991 ◽

Vol 243 ◽

Author(s):

Jean-Paul Hahn ◽

Gernot Kostorz

Keyword(s):

Lead Zirconate Titanate ◽

Figure Of Merit ◽

Sintered Density ◽

Lead Zirconate ◽

Pyroelectric Coefficient ◽

Low Dielectric Constant ◽

Electrophysical Properties ◽

Low Dielectric ◽

High Figure ◽

Titanate Ceramics

AbstractThe aim of this work was to develop a ceramic material exhibiting a large pyroelectric coefficient p = -dP/dT (P = polarization, T = temperature) and a low dielectric constant ∈ in order to obtain a high figure of merit F = p/∈pCp for applications in infrared temperature sensing (p denotes the sintered density of the ceramic, cp the specific heat). The influence of the dopants is paramount, and it was only possible to investigate a few promising ones. Best results were obtained for PZT 60/40 (Zr:Ti=60:40) doped with 2 mol% MnO2. The effects of various dopants and some aging results for PZT 60/40 with MnO2 are presented.

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Fabrication of Bimorph Lead Zirconate Titanate Thick Films on Metal Substrates Via the Cold Sintering Process

SSRN Electronic Journal ◽

10.2139/ssrn.3525136 ◽

2020 ◽

Author(s):

Dixiong Wang ◽

Sinan Dursun ◽

Lisheng Gao ◽

Carl S. Morandi ◽

Clive A. Randall ◽

...

Keyword(s):

Lead Zirconate Titanate ◽

Thick Films ◽

Lead Zirconate ◽

Sintering Process ◽

Metal Substrates ◽

Zirconate Titanate

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Lead zirconate titanate thick films by sol-gel method for piezoelectric applications

Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002. ◽

10.1109/isaf.2002.1195969 ◽

2003 ◽

Author(s):

Y. Ohya ◽

T. Tamakoshi ◽

T. Ban ◽

Y. Takahashi

Keyword(s):

Lead Zirconate Titanate ◽

Thick Films ◽

Sol Gel ◽

Lead Zirconate ◽

Gel Method ◽

Sol Gel Method ◽

Zirconate Titanate

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Sol-Gel Derived PZT Thick Films with Nano-Sized Microstructure

MRS Proceedings ◽

10.1557/proc-748-u14.9 ◽

2002 ◽

Vol 748 ◽

Cited By ~ 1

Author(s):

C. L. Zhao ◽

Z. H. Wang ◽

W. Zhu ◽

O. K. Tan ◽

H. H. Hng

Keyword(s):

Lead Zirconate Titanate ◽

Electromechanical Coupling ◽

Thick Films ◽

Sol Gel ◽

Essential Element ◽

Processing Parameters ◽

Lead Zirconate ◽

Piezoelectric Response ◽

Coupling Coefficients ◽

Pzt Films

ABSTRACTLead zirconate titanate (PZT) films are promising for acoustic micro-devices applications because of their extremely high electromechanical coupling coefficients and excellent piezoelectric response. Thicker PZT films are crucial for these acoustic applications. A hybrid sol-gel technology has been developed as a new approach to realize simple and cost-effective fabrication of high quality PZT thick films. In this paper, PZT53/47 thick films with a thickness of 5–50 μm are successfully deposited on Pt-coated silicon wafer by using the hybrid sol-gel technology. The obtained PZT thick films are dense, crack-free, and have a nano-sized microstructure. The processing parameters of this technology have been evaluated. The microstructure of the film has been observed using field-emission scanning electron microscopy and the crystallization process has been monitored by the X-ray diffraction. The thick films thus made are good candidates for fabrication of piezoelectric diaphragm which will be an essential element of microspeaker and microphone arrays.

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