ZnO:Sb/ZnO:Ga Light Emitting Diode onc-Plane Sapphire by Molecular Beam Epitaxy

2010 ◽  
Vol 3 (3) ◽  
pp. 032101 ◽  
Author(s):  
Zheng Yang ◽  
Sheng Chu ◽  
Winnie V. Chen ◽  
Lin Li ◽  
Jieying Kong ◽  
...  
2008 ◽  
Vol 5 (9) ◽  
pp. 3069-3072 ◽  
Author(s):  
Hiroto Sekiguchi ◽  
Kei Kato ◽  
Akihiko Kikuchi ◽  
Katsumi Kishino

1998 ◽  
Vol 34 (15) ◽  
pp. 1519 ◽  
Author(s):  
M. Jalonen ◽  
J. Köngäs ◽  
M. Toivonen ◽  
P. Savolainen ◽  
S. Orsila ◽  
...  

2007 ◽  
Vol 19 (2) ◽  
pp. 109-111 ◽  
Author(s):  
S. K. Ray ◽  
T. L. Choi ◽  
K. M. Groom ◽  
H. Y. Liu ◽  
M. Hopkinson ◽  
...  

2014 ◽  
Vol 2 (21) ◽  
pp. 4112-4116 ◽  
Author(s):  
Wenliang Wang ◽  
Yunhao Lin ◽  
Weijia Yang ◽  
Zuolian Liu ◽  
Shizhong Zhiou ◽  
...  

High-quality nonpolar m-plane GaN-based light-emitting diode (LED) wafers have been deposited on LiGaO2(100) substrates by a combination of pulsed laser deposition and molecular beam epitaxy technologies.


2005 ◽  
Vol 44 (6A) ◽  
pp. 3951-3953 ◽  
Author(s):  
Tsuyoshi Sunohara ◽  
Cheng Li ◽  
Yoshinori Ozawa ◽  
Takashi Suemasu ◽  
Fumio Hasegawa

1996 ◽  
Vol 422 ◽  
Author(s):  
J. Stimmer ◽  
A. Reittinger ◽  
G. Abstreiter ◽  
H. Holzbrecher ◽  
Ch. Buchal

AbstractWe report on a systematic study of the growth parameters of erbium-oxygen-doped silicon grown by molecular beam epitaxy. The surface quality of the grown layers was measured in situ by RHEED. The samples were characterized by photoluminescence measurements and SIMS. An Er-O-doped Si light emitting diode grown with the optimized parameters is presented.


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