Visualization of Grain Boundary as Blocking Layer for Oxygen Tracer Diffusion and a Proposed Defect Model in Non Doped BaTiO3Ceramics

2011 ◽  
Vol 4 (5) ◽  
pp. 055801 ◽  
Author(s):  
Ken Watanabe ◽  
Isao Sakaguchi ◽  
Shunichi Hishita ◽  
Naoki Ohashi ◽  
Hajime Haneda
Keyword(s):  
Grain Boundary ◽  
Tracer Diffusion ◽  
Blocking Layer ◽  
Defect Model ◽  
Oxygen Tracer

Oxygen Tracer Diffusion in BaTiO3 Ceramics - Effect of Zr Impurity from Planetary Ball Milling

2013 ◽  
Vol 566 ◽  
pp. 262-265 ◽  
Author(s):  
Ken Watanabe ◽  
I. Sakaguchi ◽  
S. Hishita ◽  
H. Haneda ◽  
N. Ohashi
Keyword(s):  
Grain Boundary ◽  
Ball Milling ◽  
Oxygen Diffusion ◽  
Oxygen Vacancies ◽  
Imaging Technique ◽  
Tracer Diffusion ◽  
Milling Process ◽  
Ion Imaging ◽  
Planetary Ball Milling ◽  
Oxygen Tracer

We investigated the effect of Zr impurities on the oxygen diffusion pathway in BaTiO3 ceramics by using an ion-imaging technique. Zr impurities were introduced into BaTiO3 ceramics by a planetary ball milling process. The oxygen tracer diffused quickly from the surface up to the grain boundary and then appeared as discontinuous steps at the grain boundary. The results indicate that the grain boundary acted as a blocking layer against oxygen diffusion. The blocking for oxygen diffusion at the grain boundary is thought to originate during the formation and distribution of complex defects between the charged oxygen vacancies and the Ba vacancies near the grain boundary.

Limits to the rate of oxygen transport in mixed-conducting oxides

2017 ◽  
Vol 5 (38) ◽  
pp. 20334-20350 ◽  
Author(s):  
Roger A. De Souza
Keyword(s):  
Oxygen Transport ◽  
Tracer Diffusion ◽  
Surface Exchange ◽  
Conducting Oxides ◽  
Oxygen Surface Exchange ◽  
Oxygen Tracer ◽  
Oxygen Surface

Chemically reasonable limits to the rates of oxygen tracer diffusion and oxygen surface exchange in acceptor-doped oxides are examined.

Oxygen tracer diffusion through BaF2and MgO overcoats on YBa2Cu3O7−Δ

1991 ◽  
Vol 59 (6) ◽  
pp. 724-726 ◽  
Author(s):  
S. B. Wong ◽  
J. J. Vajo ◽  
A. T. Hunter ◽  
C. W. Nieh
Keyword(s):  
Tracer Diffusion ◽  
Oxygen Tracer

Oxygen diffusion in amorphous and partially crystalline gallium oxide

2019 ◽  
Vol 21 (8) ◽  
pp. 4268-4275 ◽  
Author(s):  
Alexandra von der Heiden ◽  
Manuel Bornhöfft ◽  
Joachim Mayer ◽  
Manfred Martin
Keyword(s):  
Activation Energy ◽  
Diffusion Coefficients ◽  
Low Temperatures ◽  
Oxygen Diffusion ◽  
Gallium Oxide ◽  
Tracer Diffusion ◽  
Tof Sims ◽  
Tracer Diffusion Coefficients ◽  
Oxygen Tracer

We established a TTT diagram of crystallisation of gallium oxide. Determination of oxygen tracer diffusion coefficients by IEDP/ToF-SIMS allowed us to access the activation energy for amorphous GaO1.5 at low temperatures.

Oxygen tracer diffusion in the YBa2Cu3Oy superconductor

2001 ◽  
Vol 351 (4) ◽  
pp. 357-362 ◽  
Author(s):  
S. Tsukui ◽  
M. Adachi ◽  
R. Oshima ◽  
H. Nakajima ◽  
F. Toujou ◽  
...  
Keyword(s):  
Tracer Diffusion ◽  
Oxygen Tracer

Oxygen Tracer Diffusion in Sol-Gel Derived Pb(Zr,Ti)O3 thin Films

1993 ◽  
Vol 310 ◽  
Author(s):  
John J. Vajo ◽  
L.A. Momoda ◽  
S.B. Wong ◽  
G.S. Kamath
Keyword(s):  
Thin Films ◽  
Oxygen Diffusion ◽  
Sol Gel ◽  
Finite Thickness ◽  
Tracer Diffusion ◽  
Pzt Films ◽  
Gel Technique ◽  
Low Levels ◽  
Secondary Ion ◽  
Oxygen Tracer

AbstractWe have studied oxygen diffusion in thin films of Pb(Zr,Ti)O3 on Pt/Ti/SiO2/Si <100> multilayer substrates using 18O as a tracer. The PZT films were synthesized using the sol-gel technique and crystallized in air at 650° C for 30 minutes. Diffusion experiments were conducted in one atmosphere of 18O2 at tmipertures between 400-600°C, the extent of exchange was monitored using secondary ion mass spectromentry. Exchange profiles were modeled using solutions of the diffusion equation with boundary conditions for a layer with finite thickness. Significant exchange (>60%) of 16O by 18O was measured after treatment under conditions similar to those used for crystallization. At low levels of exchange, oxygen diffusion does not follow a simple Fickian profile and differences exist between nominally identical films. These results suggest that oxygen exchange is sensitive to the film's microstructure.

Oxygen Tracer Diffusion in Single-Crystal CaTiO3

1996 ◽  
Vol 124 (1) ◽  
pp. 195-197 ◽  
Author(s):  
Isao Sakaguchi ◽  
Hajime Haneda
Keyword(s):  
Single Crystal ◽  
Tracer Diffusion ◽  
Oxygen Tracer
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