Non-equilibrium Electron Dynamics Phenomena in Scaled Sub-100 nm Gate Length Metal Semiconductor Field Effect Transistors: Gate-fringing, Velocity Overshoot, and Short-channel Tunneling
1998 ◽
Vol 37
(Part 1, No. 9A)
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pp. 4672-4679
Keyword(s):
1999 ◽
Vol 43
(2)
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pp. 335-341
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1972 ◽
Vol 19
(5)
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pp. 652-654
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2018 ◽
Vol 1034
◽
pp. 012003
Keyword(s):
Keyword(s):
2017 ◽
Vol 16
(1)
◽
pp. 69-74
1991 ◽
Vol 30
(Part 2, No. 4A)
◽
pp. L535-L537
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