Memory Operation of Silicon Quantum-Dot Floating-Gate Metal-Oxide-Semiconductor Field-Effect Transistors

2001 ◽  
Vol 40 (Part 2, No. 7B) ◽  
pp. L721-L723 ◽  
Author(s):  
Atsushi Kohno ◽  
Hideki Murakami ◽  
Mitsuhisa Ikeda ◽  
Seiichi Miyazaki ◽  
Masataka Hirose
Keyword(s):  
Quantum Dot ◽  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Metal Oxide Semiconductor ◽  
Floating Gate ◽  
Oxide Semiconductor ◽  
Silicon Quantum Dot

Multiple-Step Electron Charging in Silicon-Quantum-Dot Floating Gate Metal-Oxide-Semiconductor Memories

2003 ◽  
Vol 42 (Part 1, No. 6B) ◽  
pp. 4134-4137 ◽  
Author(s):  
Mitsuhisa Ikeda ◽  
Yusuke Shimizu ◽  
Hideki Murakami ◽  
Seiichi Miyazaki
Keyword(s):  
Quantum Dot ◽  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Floating Gate ◽  
Oxide Semiconductor ◽  
Silicon Quantum Dot ◽  
Multiple Step

Silicon Quantum Dot in a Metal-Oxide-Semiconductor Field Effect Transistor (MOSFET) Structure

1999 ◽  
Vol 38 (Part 1, No. 1B) ◽  
pp. 469-472 ◽  
Author(s):  
Maroun Khoury ◽  
Allen Gunther ◽  
David P. Pivin ◽  
Mary Jo Rack ◽  
David K. Ferry
Keyword(s):  
Quantum Dot ◽  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Silicon Quantum Dot ◽  
Effect Transistor
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