Gate-Induced Drain Leakage Currents in Metal Oxide Semiconductor Field Effect Transistors with High-κ Dielectric
2002 ◽
Vol 41
(Part 1, No. 7A)
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pp. 4432-4435
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Keyword(s):
1997 ◽
Vol 36
(Part 1, No. 12A)
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pp. 7104-7109
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2018 ◽
Vol 57
(6S1)
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pp. 06HD03
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Keyword(s):
2020 ◽
Vol 8
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pp. 9-14
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2007 ◽
Vol 46
(4B)
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pp. 2054-2057
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2009 ◽
Vol 48
(4)
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pp. 04C100
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Keyword(s):
2009 ◽
Vol 48
(9)
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pp. 091404
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