Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy

2004 ◽  
Vol 43 (4B) ◽  
pp. 2230-2234 ◽  
Author(s):  
Seungbae Park ◽  
Jinhee Heo ◽  
T. W. Kim ◽  
Ilsub Chung
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Tunneling Junction ◽  
Probe Microscopy ◽  
Magnetic Tunneling Junction ◽  
Magnetic Tunneling

Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films

2013 ◽  
Vol 53 (9-11) ◽  
pp. 1430-1433 ◽  
Author(s):  
Alexander Hofer ◽  
Roland Biberger ◽  
Günther Benstetter ◽  
Björn Wilke ◽  
Holger Göbel
Keyword(s):  
Organic Semiconductor ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Semiconductor Films ◽  
Probe Microscopy

Local electrical characterization of SOI wafers by scanning probe microscopy

2002 ◽  
Vol 91-92 ◽  
pp. 156-159 ◽  
Author(s):  
Yoshimori Ishizuka ◽  
Takayuki Uchihashi ◽  
Haruhiko Yoshida ◽  
Seigo Kishino
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Probe Microscopy
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