Numerical Foundation of Hot-Electron Diffraction Experiment Based on Ballistic Electron Emission Microscope

2004 ◽  
Vol 43 (11A) ◽  
pp. 7390-7394
Author(s):  
Nobuya Machida ◽  
Hiroyuki Kanoh ◽  
Kazuhito Furuya
2021 ◽  
Author(s):  
Dan Wang ◽  
Xuan Wang ◽  
Guoqian Liao ◽  
Zhe Zhang ◽  
Yutong Li

Abstract To integrate a terahertz pump into an ultrafast electron diffraction (UED) experiment has attracted much attention due to its potential to initiate and detect the structural dynamics both directly. However, the deflection of the electron probe by the electromagnetic field of the terahertz pump alters the incident angle of the electron probe on the sample, impeding it from recording structural information afterwards. In this article, we studied this issue by a theoretical simulation of the terahertz-induced deflection effect on the electron probe, and came up with several possible schemes to reduce such effect. As a result, a terahertz-pump-electron-probe UED experiment with a temporal resolution comparable to the terahertz period is realized. We also found that MeV UED was more suitable for such terahertz pump experiment.


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