Stress Technology Impact on Device Performances and Reliability for Sub-90 nm Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors
2006 ◽
Vol 45
(4B)
◽
pp. 3053-3057
◽
2010 ◽
Vol 28
(1)
◽
pp. C1G7-C1G11
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
◽
2007 ◽
Vol 46
(12)
◽
pp. 7635-7638
◽
2009 ◽
Vol 48
(4)
◽
pp. 04C051
◽
2008 ◽
Vol 47
(4)
◽
pp. 2124-2126
◽
2011 ◽
Vol 50
(4)
◽
pp. 04DC12
◽