Layer-by-Layer Growth of AlN on ZnO(000$\bar{1}$) Substrates at Room Temperature

2006 ◽  
Vol 45 (No. 43) ◽  
pp. L1139-L1141 ◽  
Author(s):  
Kohei Ueno ◽  
Atsushi Kobayashi ◽  
Jitsuo Ohta ◽  
Hiroshi Fujioka
1999 ◽  
Vol 580 ◽  
Author(s):  
St. Lackner ◽  
R. Abermann

AbstractThe growth stress of metal films was measured continuously both during as well as after their deposition under UHV-conditions with a cantilever beam technique. The metal films were deposited onto 10 rim thick alumina substrate films prepared by reactive evaporation of Al in an oxygen atmosphere. The substrate temperature for the metal deposition was varied from -20°C to 500°C.The growth stress of both titanium and aluminum films deposited at room temperature and above is characteristic of island growth and the formation of a polycrystalline film. The film stress built up in these films decreases with increasing substrate temperature. Below RT the growth stress of titanium films indicates a transition from island growth to layer by layer growth due to a reduced adatom mobility. The temperature range in which this transition in the growth mode occurs is strongly affected by impurities in the Ti-evaporation source material and gas ambient.In the last part of this paper we present results of experiments in which the above metals were evaporated simultaneously from separate sources to form alloy films with TiAl3-stoichiometry. Sudden changes in the incremental film stress are tentatively attributed to segregation and phase formation phenomena.


2003 ◽  
Vol 43 (1A/B) ◽  
pp. L53-L55 ◽  
Author(s):  
Atsushi Kobayashi ◽  
Hiroshi Fujioka ◽  
Jitsuo Ohta ◽  
Masaharu Oshima

2010 ◽  
Vol 3 (2) ◽  
pp. 021001 ◽  
Author(s):  
Tomofumi Kajima ◽  
Atsushi Kobayashi ◽  
Kazuma Shimomoto ◽  
Kohei Ueno ◽  
Tomoaki Fujii ◽  
...  

2000 ◽  
Vol 07 (03) ◽  
pp. 307-331 ◽  
Author(s):  
P. CASTRUCCI ◽  
R. GUNNELLA ◽  
N. PINTO ◽  
R. BERNARDINI ◽  
M. DE CRESCENZI ◽  
...  

Near edge X-ray absorption spectroscopy (XAS), X-ray photoelectron diffraction (XPD) and Auger electron diffraction (AED) are powerful techniques for the qualitative study of the structural and electronic properties of several systems. The recent development of a multiple scattering approach to simulating experimental spectra opened a friendly way to the study of structural environments of solids and surfaces. This article reviews recent X-ray absorption experiments using synchrotron radiation which were performed at Ge L edges and core level electron diffraction measurements obtained using a traditional X-ray source from Ge core levels for ultrathin Ge films deposited on silicon substrates. Thermodynamics and surface reconstruction have been found to play a crucial role in the first stages of Ge growth on Si(001) and Si(111) surfaces. Both techniques show the occurrence of intermixing processes even for room-temperature-grown Ge/Si(001) samples and give a straightforward measurement of the overlayer tetragonal distortion. The effects of Sb as a surfactant on the Ge/Si(001) interface have also been investigated. In this case, evidence of layer-by-layer growth of the fully strained Ge overlayer with a reduced intermixing is obtained when one monolayer of Sb is predeposited on the surface.


2007 ◽  
Vol 14 (05) ◽  
pp. 911-914 ◽  
Author(s):  
P. J. GODOWSKI ◽  
Z. S. LI ◽  
J. BORK ◽  
J. ONSGAARD

The growth process of platinum on Ru (0001) near room temperature was characterized using photoelectron spectroscopy of high resolution. The binding energy position and intensity of the Pt 4f7/2 and Ru 3d5/2 core levels as well as the shape and structure of the valence band spectra corresponding to the different stages of the deposition were analyzed. Up to ca. two adsorbate monolayers, the intensity changes of the peaks indicated layer-by-layer growth mode. The surface core level shifts of Ru and Pt levels were evaluated as -0.33 and -0.476 eV, respectively. The valence band spectra show a rather weak interaction between the d-bands of Pt and Ru .


2003 ◽  
Vol 780 ◽  
Author(s):  
P. Thomas ◽  
E. Nabighian ◽  
M.C. Bartelt ◽  
C.Y. Fong ◽  
X.D. Zhu

AbstractWe studied adsorption, growth and desorption of Xe on Nb(110) using an in-situ obliqueincidence reflectivity difference (OI-RD) technique and low energy electron diffraction (LEED) from 32 K to 100 K. The results show that Xe grows a (111)-oriented film after a transition layer is formed on Nb(110). The transition layer consists of three layers. The first two layers are disordered with Xe-Xe separation significantly larger than the bulk value. The third monolayer forms a close packed (111) structure on top of the tensile-strained double layer and serves as a template for subsequent homoepitaxy. The adsorption of the first and the second layers are zeroth order with sticking coefficient close to one. Growth of the Xe(111) film on the transition layer proceeds in a step flow mode from 54K to 40K. At 40K, an incomplete layer-by-layer growth is observed while below 35K the growth proceeds in a multilayer mode.


Nanomaterials ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 1631
Author(s):  
Qiang Zhang ◽  
Yohanes Pramudya ◽  
Wolfgang Wenzel ◽  
Christof Wöll

Metal organic frameworks have emerged as an important new class of materials with many applications, such as sensing, gas separation, drug delivery. In many cases, their performance is limited by structural defects, including vacancies and domain boundaries. In the case of MOF thin films, surface roughness can also have a pronounced influence on MOF-based device properties. Presently, there is little systematic knowledge about optimal growth conditions with regard to optimal morphologies for specific applications. In this work, we simulate the layer-by-layer (LbL) growth of the HKUST-1 MOF as a function of temperature and reactant concentration using a coarse-grained model that permits detailed insights into the growth mechanism. This model helps to understand the morphological features of HKUST-1 grown under different conditions and can be used to predict and optimize the temperature for the purpose of controlling the crystal quality and yield. It was found that reactant concentration affects the mass deposition rate, while its effect on the crystallinity of the generated HKUST-1 film is less pronounced. In addition, the effect of temperature on the surface roughness of the film can be divided into three regimes. Temperatures in the range from 10 to 129 °C allow better control of surface roughness and film thickness, while film growth in the range of 129 to 182 °C is characterized by a lower mass deposition rate per cycle and rougher surfaces. Finally, for T larger than 182 °C, the film grows slower, but in a smooth fashion. Furthermore, the potential effect of temperature on the crystallinity of LbL-grown HKUST-1 was quantified. To obtain high crystallinity, the operating temperature should preferably not exceed 57 °C, with an optimum around 28 °C, which agrees with experimental observations.


2020 ◽  
Vol 11 (24) ◽  
pp. 10548-10551
Author(s):  
Aswani Sathish Lathika ◽  
Shammi Rana ◽  
Anupam Prasoon ◽  
Pooja Sindhu ◽  
Debashree Roy ◽  
...  

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