scholarly journals Statistical reliability analysis under process variation and aging effects

Author(s):  
Yinghai Lu ◽  
Li Shang ◽  
Hai Zhou ◽  
Hengliang Zhu ◽  
Fan Yang ◽  
...  
2011 ◽  
Vol 9 ◽  
pp. 225-230
Author(s):  
S. More ◽  
M. Fulde ◽  
F. Chouard ◽  
D. Schmitt-Landsiedel

Abstract. This paper discusses reliability analysis of a buffer circuit targeted for an analog to digital converter application. The circuit designed in a 32 nm high-κ metal gate CMOS technology was investigated by circuit simulation and sensitivity analysis. This analysis was conducted for realistic time varying (AC) stress. As aging effects, negative and positive bias temperature instability, conducting and non-conducting hot carrier injection are taken into consideration. The aging contributions of these effects on the different transistors in the buffer circuit and on different buffer performance figures are evaluated. Using these results, the impact of an aged buffer circuit on the performance of a successive approximation ADC circuit is evaluated. The most severely affected performance due to aging is amplifier offset, which leads to time varying gain error in the ADC circuit.


2021 ◽  
Author(s):  
Malaya Kumar Biswal M

Reliability of the spacecraft determines the extent of success probability and mission accomplishment. Despite effective testing and integration, the complexity of the space environment affects reliability. In this paper, we investigate the reliability behaviour of interplanetary spacecraft operating at different interplanetary extremities. So, our investigation assesses spacecraft inhered in interplanetary space with the context of the interplanetary boundary (between distinct planetary orbit or within the bounds of heliopause). From the perspective of spacecraft reliability in interplanetary space, we have excluded planetary landers, atmospheric probes, and satellites maneuvering earth orbit. Thus, we have identified 131 spacecraft (includes 82 probes within the bounds of Sun and the Earth, and 49 within the bounds of Earth and Heliopause) along with their gross mass at launch and lifespan. Based on acquired data, we first conduct a non-parametric analysis of spacecraft reliability to obtain two reliability curves for distinct interplanetary extremity. We then perform a parametric fit (Weibull Distribution) over the data to show the analogy of reliability behaviour. Results showed that the spacecraft operating beyond the extremity of the Earth and the Mars exhibits increased reliability than any other interplanetary extremity. In addition to this, we execute reliability analysis over spacecraft of various mass categories (Small-Medium-Large) to testify the reliability effect interpreted by Dubos in 2010. Finally, we discuss the possible factors and causes accountable for the difference in reliability behaviour concerning the spacecraft design and integration, testing, and constraints in considering spacecraft mass.


2010 ◽  
Vol 67 (5-6) ◽  
pp. 584-595 ◽  
Author(s):  
Gregory F. Dubos ◽  
Jean-Francois Castet ◽  
Joseph H. Saleh

Author(s):  
Junxiang Li ◽  
Jianqiao Chen ◽  
Zhiqiang Chen

Performance and reliability of structures will deteriorate with the effects of loads, environment, and interior factors of materials. In this article, a novel cumulative damage model is developed for time-dependent reliability analysis of deteriorating structures. The deterioration is a combination of three stochastic processes: the gradual deterioration posed by aging effects, the sudden deterioration caused by transient loads, and the additional deterioration introduced by sustained loads. The aging effect is modeled as a gamma process, while the transient load is described by a Poisson process. The sustained load is modeled by a stationary binomial process and a Poisson square wave process, respectively. The load threshold for three different scenarios are all considered and applied to not only the transient loads but also the sustained loads. The time-dependent reliability of deteriorating structures is then evaluated based on this model via semi-analytical methods or numerical simulation methods. Three numerical examples and an example involving a natural gas pipeline are used to validate the effectiveness of the proposed model for computing the time-dependent reliability.


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