scholarly journals Charge Trapping Memory with 2.85-nm Si-Nanoparticles Embedded in HfO2

2015 ◽  
Vol 66 (40) ◽  
pp. 17-21
Author(s):  
N. El-Atab ◽  
B. B. Turgut ◽  
A. Okyay ◽  
A. Nayfeh
2006 ◽  
Vol 45 (4B) ◽  
pp. 3179-3184
Author(s):  
Lei Sun ◽  
Liyang Pan ◽  
Huiqing Pang ◽  
Ying Zeng ◽  
Zhaojian Zhang ◽  
...  

2015 ◽  
Vol 26 (45) ◽  
pp. 455704 ◽  
Author(s):  
Jianling Meng ◽  
Rong Yang ◽  
Jing Zhao ◽  
Congli He ◽  
Guole Wang ◽  
...  

2019 ◽  
Vol 62 (12) ◽  
Author(s):  
Kai Xi ◽  
Jinshun Bi ◽  
Sandip Majumdar ◽  
Bo Li ◽  
Jing Liu ◽  
...  

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