Elimination of Post Cu-CMP Watermark by Optimizing Post CMP Clean to Control Cu Dissolution

2019 ◽  
Vol 11 (2) ◽  
pp. 387-394 ◽  
Author(s):  
Sebastien Petitdidier ◽  
Maxime Mellier ◽  
Chantal Trouiller ◽  
Catherine Euvrard ◽  
Marc Juhel
Keyword(s):  
Cu Cmp ◽  
1999 ◽  
Vol 566 ◽  
Author(s):  
M. Hariharaputhiran ◽  
S. Ramarajan ◽  
Y Li ◽  
S.V. Babu ◽  
S.V. Babu

Hydroxyl radical generation has been observed during Cu CMP using hydrogen peroxide-glycine based slurries. While the Cu dissolution/polish rates increased with increasing glycine concentration, the copper dissolution rate decreased with increasing peroxide concentration indicating the occurrence of both dissolution and passive film formation during CMP. This is further confirmed by both in situ and ex situ electrochemical experiments.


2004 ◽  
Vol 462-463 ◽  
pp. 161-167 ◽  
Author(s):  
S. Balakumar ◽  
X.T. Chen ◽  
Y.W. Chen ◽  
T. Selvaraj ◽  
B.F. Lin ◽  
...  
Keyword(s):  

2004 ◽  
Vol 40 (1) ◽  
pp. 26
Author(s):  
Nam-Hoon Kim ◽  
Eui-Goo Chang

2009 ◽  
Vol 1157 ◽  
Author(s):  
Shantanu Tripathi ◽  
Fiona M. Doyle ◽  
David A. Dornfeld

AbstractDuring copper CMP, abrasives and asperities interact with the copper at the nano-scale, partially removing protective films. The local Cu oxidation rate increases, then decays with time as the protective film reforms. In order to estimate the copper removal rate and other Cu-CMP output parameters with a mechanistic model, the passivation kinetics of Cu, i.e. the decay of the oxidation current with time after an abrasive/copper interaction, are needed. For the first time in studying Cu-CMP, microelectrodes were used to reduce interference from capacitive charging, IR drops and low diffusion limited currents, problems typical with traditional macroelectrodes. Electrochemical impedance spectroscopy (EIS) was used to obtain the equivalent circuit elements associated with different electrochemical phenomena (capacitive, kinetics, diffusion etc.) at different polarization potentials. These circuit elements were used to interpret potential-step chronoamperometry results in inhibiting and passivating solutions, notably to distinguish between capacitive charging and Faradaic currents.Chronoamperometry of Cu in acidic aqueous glycine solution containing the corrosion inhibitor benzotriazole (BTA) displayed a very consistent current decay behavior at all potentials, indicating that the rate of current decay was controlled by diffusion of BTA to the surface. In basic aqueous glycine solution, Cu (which undergoes passivation by a mechanism similar to that operating in weakly acidic hydrogen peroxide slurries) displayed similar chronoamperometric behavior for the first second or so at all anodic potentials. Thereafter, the current densities at active potentials settled to values around those expected from polarization curves, whereas the current densities at passive potentials continued to decline. Oxidized Cu species typically formed at ‘active’ potentials were found to cause significant current decay at active potentials and at passive potentials before more protective passive films form. This was established from galvanostatic experiments.


2006 ◽  
Vol 153 (9) ◽  
pp. G830 ◽  
Author(s):  
S. Kondoju ◽  
C. Juncker ◽  
P. Lucas ◽  
S. Raghavan ◽  
P. Fischer ◽  
...  
Keyword(s):  

2019 ◽  
Vol 33 (10) ◽  
pp. 107-113 ◽  
Author(s):  
Chao-Chang A. Chen ◽  
Chi-Hsiang Hsieh
Keyword(s):  

2005 ◽  
Vol 103-104 ◽  
pp. 275-278
Author(s):  
Yi Koan Hong ◽  
Ja Hyung Han ◽  
Jin Hyung Lee ◽  
Jin Goo Park ◽  
Ahmed A. Busnaina

The adhesion force and removal of alumina particles on Cu, Ta, TEOS, SILKTM, Aurora and FSG wafer surfaces were experimentally and theoretically investigated in slurry solutions of different pHs. These wafer surfaces showed negative zeta potentials in the investigated pH ranges with exception of FSG and Ta. However, the zeta potentials of FSG surface drastically decreased with increasing pH. The lowest adhesion force and smallest number of alumina particles were measured between alumina particle and FSG surface in a slurry solution of pH 11. Alkaline slurry was much more desirable in controlling the level of particle contamination during Cu CMP. The pH of the slurry and zeta potentials of the surfaces played important roles in controlling the interaction force.


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