Characterization of Annealing Effects in Ultra-Shallow Boron-Implanted Si Wafers using Raman Scattering

2019 ◽  
Vol 19 (1) ◽  
pp. 127-133 ◽  
Author(s):  
Masashi Fukumoto ◽  
Hiroaki Minami ◽  
Noriyuki Hasuike ◽  
Hiroshi Harima ◽  
Masahiro Yoshimoto ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Annealing Effects

Raman scattering characterization of group III-nitride epitaxial layers including cubic phase

1998 ◽  
Vol 189-190 ◽  
pp. 435-438 ◽  
Author(s):  
Hiroshi Harima ◽  
Toshiaki Inoue ◽  
Shin-ichi Nakashima ◽  
Hajime Okumura ◽  
Yuuki Ishida ◽  
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Keyword(s):  
Raman Scattering ◽  
Cubic Phase ◽  
Epitaxial Layers ◽  
Group Iii ◽  
Group Iii Nitride

scholarly journals Characterization of the ion-amorphization process and thermal annealing effects on third generation SiC fibers and 6H-SiC

2015 ◽  
Vol 1 ◽  
pp. 8 ◽  
Author(s):  
Juan Huguet-Garcia ◽  
Aurélien Jankowiak ◽  
Sandrine Miro ◽  
Renaud Podor ◽  
Estelle Meslin ◽  
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Thermal Annealing ◽  
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Annealing Effects

In vivo characterization of protein uptake by yeast cell envelope: single cell AFM imaging and μ-tip-enhanced Raman scattering study

The Analyst ◽  
2013 ◽  
Vol 138 (18) ◽  
pp. 5371 ◽  
Author(s):  
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Valentinas Snitka ◽  
Elena Serviene ◽  
Ingrida Bruzaite ◽  
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Afm Imaging ◽  
Enhanced Raman Scattering ◽  
Scattering Study ◽  
In Vivo Characterization
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