Non-Enzymatic Glucose Detection Using Free Standing Hollow Boron-Doped Diamond Nanorod Electrodes

2019 ◽  
Vol 166 (8) ◽  
pp. B576-B580 ◽  
Author(s):  
Young-Kyun Lim ◽  
Min-Jung Song ◽  
Dae-Soon Lim
2017 ◽  
Vol 98 ◽  
pp. 76-82 ◽  
Author(s):  
Siriwan Nantaphol ◽  
Takeshi Watanabe ◽  
Naohiro Nomura ◽  
Weena Siangproh ◽  
Orawon Chailapakul ◽  
...  

2002 ◽  
Vol 5 (3) ◽  
pp. D1 ◽  
Author(s):  
Keisuke Ohnishi ◽  
Yasuaki Einaga ◽  
Hideo Notsu ◽  
Chiaki Terashima ◽  
Tata Narasinga Rao ◽  
...  

2020 ◽  
Vol 862 ◽  
pp. 114016 ◽  
Author(s):  
Robert Bogdanowicz ◽  
Mateusz Ficek ◽  
Natalia Malinowska ◽  
Sanju Gupta ◽  
Romney Meek ◽  
...  

Langmuir ◽  
2009 ◽  
Vol 25 (17) ◽  
pp. 10329-10336 ◽  
Author(s):  
Ileana González-González ◽  
Estevão Rosim Fachini ◽  
M. Aulice Scibioh ◽  
Donald A. Tryk ◽  
Michele Tague ◽  
...  

2018 ◽  
Vol 25 (01) ◽  
pp. 1850039 ◽  
Author(s):  
TIANQI ZHAO ◽  
XINCHANG WANG ◽  
FANGHONG SUN

In this study, the residual stress of boron-doped diamond (BDD) films is investigated as a function of boron doping level using X-ray diffraction (XRD) analysis. Boron doping level is controlled from 1000[Formula: see text]ppm to 9000[Formula: see text]ppm by dissolving trimethyl borate into acetone. BDD films are deposited on silicon wafers using a bias-enhanced hot filament chemical vapor deposition (BE-HFCVD) system. Residual stress calculated by [Formula: see text] method varies linearly from [Formula: see text]2.4[Formula: see text]GPa to [Formula: see text]1.1[Formula: see text]GPa with increasing boron doping level. On the BDD film of [Formula: see text]1.75[Formula: see text]GPa, free standing BDD cantilevers are fabricated by photolithography and ICP-RIE processes, then tested by laser Doppler vibrometer (LDV). A cantilever with resonant frequency of 183[Formula: see text]KHz and [Formula: see text] factor of 261 in the air is fabricated.


2003 ◽  
Vol 764 ◽  
Author(s):  
Hiroyuki Togawa ◽  
Hideki Ichinose

AbstractAtomic resolution high-voltage transmission electron microscopy and electron energy loss spectroscopy were performed on grain boundaries of boron-doped diamond, cooperated with the ab-initio calculation. Segregated boron in the {112}∑3 boundary was caught by the EELS spectra. The change in atomic structure of the segregated boundary was successfully observed from the image by ARHVTEM. Based on the ARHVTEM image, a segregted structure model was proposed.


2015 ◽  
Vol 14 (6) ◽  
pp. 1339-1345
Author(s):  
Monica Ihos ◽  
Florica Manea ◽  
Maria Jitaru ◽  
Corneliu Bogatu ◽  
Rodica Pode

Processes ◽  
2020 ◽  
Vol 8 (6) ◽  
pp. 666 ◽  
Author(s):  
Nikolay Ivanovich Polushin ◽  
Alexander Ivanovich Laptev ◽  
Boris Vladimirovich Spitsyn ◽  
Alexander Evgenievich Alexenko ◽  
Alexander Mihailovich Polyansky ◽  
...  

Boron-doped diamond is a promising semiconductor material that can be used as a sensor and in power electronics. Currently, researchers have obtained thin boron-doped diamond layers due to low film growth rates (2–10 μm/h), with polycrystalline diamond growth on the front and edge planes of thicker crystals, inhomogeneous properties in the growing crystal’s volume, and the presence of different structural defects. One way to reduce structural imperfection is the specification of optimal synthesis conditions, as well as surface etching, to remove diamond polycrystals. Etching can be carried out using various gas compositions, but this operation is conducted with the interruption of the diamond deposition process; therefore, inhomogeneity in the diamond structure appears. The solution to this problem is etching in the process of diamond deposition. To realize this in the present work, we used triethyl borate as a boron-containing substance in the process of boron-doped diamond chemical vapor deposition. Due to the oxygen atoms in the triethyl borate molecule, it became possible to carry out an experiment on simultaneous boron-doped diamond deposition and growing surface etching without the requirement of process interruption for other operations. As a result of the experiments, we obtain highly boron-doped monocrystalline diamond layers with a thickness of about 8 μm and a boron content of 2.9%. Defects in the form of diamond polycrystals were not detected on the surface and around the periphery of the plate.


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