Effect of Nitrogen on Semiconducting Properties of Passive Films of a High Nitrogen Face-Centered-Cubic Phase Formed on Austenitic Stainless Steel

2012 ◽  
Vol 159 (8) ◽  
pp. C319-C325 ◽  
Author(s):  
X. M. Zhu ◽  
Y. Guo ◽  
Z. Q. Xing ◽  
M. K. Lei
Keyword(s):  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Passive Films ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
High Nitrogen ◽  
Semiconducting Properties ◽  
Face Centered

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

Critical factors that determine face-centered cubic to body-centered cubic phase transformation in sputter-deposited austenitic stainless steel films

2004 ◽  
Vol 19 (6) ◽  
pp. 1696-1702 ◽  
Author(s):  
X. Zhang ◽  
A. Misra ◽  
R.K. Schulze ◽  
C.J. Wetteland ◽  
H. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Phase Stability ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
Body Centered Cubic ◽  
Bcc Structure ◽  
Face Centered ◽  
Sputter Deposited

Bulk austenitic stainless steels (SS) have a face-centered cubic (fcc) structure. However, sputter deposited films synthesized using austenitic stainless steel targets usually exhibit body-centered cubic (bcc) structure or a mixture of fcc and bcc phases. This paper presents studies on the effect of processing parameters on the phase stability of 304 and 330 SS thin films. The 304 SS thin films with in-plane, biaxial residual stresses in the range of approximately 1 GPa (tensile) to approximately 300 MPa (compressive) exhibited only bcc structure. The retention of bcc 304 SS after high-temperature annealing followed by slow furnace cooling indicates depletion of Ni in as-sputtered 304 SS films. The 330 SS films sputtered at room temperature possess pure fcc phase. The Ni content and the substrate temperature during deposition are crucial factors in determining the phase stability in sputter deposited austenitic SS films.

Pitting Susceptibility and Semiconducting Properties of Passive Films of 18Cr-18Mn-2Mo-0.9N High Nitrogen Austenitic Stainless Steel

2009 ◽  
Vol 79-82 ◽  
pp. 993-996 ◽  
Author(s):  
Hua Bing Li ◽  
Zhou Hua Jiang ◽  
Zhen Li ◽  
Zu Rui Zhang
Keyword(s):  
Stainless Steel ◽  
Corrosion Resistance ◽  
Austenitic Stainless Steel ◽  
Ph Value ◽  
Chloride Ions ◽  
Passive Films ◽  
High Nitrogen ◽  
Ph Values ◽  
Pitting Corrosion Resistance ◽  
Semiconducting Properties

The effects of pH value and chloride ions concentration of the solution on pitting susceptibility and semiconducting properties of passive films formed on 18Cr-18Mn-2Mo-0.9N high nitrogen austenitic stainless steel (HNSS) were investigated using potentiodynamic polarization and capacitance measurement methods, respectively. The anodic polarization curves show that HNSS exhibits excellent pitting corrosion resistance in the solution with different pH values and chloride ions concentration, and the pitting corrosion resistance of HNSS decreases a little with decreasing the pH value or increasing the chloride ions concentration of the solution. The passive films formed on HNSS in the solution with pH values ranging from 1 to 9 or chloride ions concentration from 3.5 wt% to 20 wt% NaCl behave as n-type semiconductors. With increasing the pH value or decreasing the chloride ions concentration, the shallow donor and deeper donor densities decrease and the flat bland potential decreases, and the thickness of space charge layer increases. The deeper donor increases and then the second positive slope of straight linear region disappears with decreasing the pH value or increasing the chloride ions concentration of the solution, which can be attributed to the formation of Cr6+ is depressed.

The Influence of Cold Working on Semiconducting Properties of Passive Film and Pitting Corrosion Resistance of High Nitrogen Austenitic Stainless Steel

2011 ◽  
Vol 415-417 ◽  
pp. 784-788
Author(s):  
Li Wei Xu ◽  
Hua Bing Li ◽  
Qi Feng Ma ◽  
Zhou Hua Jiang ◽  
Dong Ping Zhan
Keyword(s):  
Stainless Steel ◽  
Corrosion Resistance ◽  
Austenitic Stainless Steel ◽  
Cold Rolling ◽  
Passive Film ◽  
Pitting Corrosion ◽  
High Nitrogen ◽  
Pitting Corrosion Resistance ◽  
Semiconducting Properties ◽  
Rolling Deformation

The effect of cold working on semiconducting properties of passive film and pitting corrosion resistance of 19Cr-18Mn-2Mo-0.9N high nitrogen austenitic stainless were investigated by anodic polarization, AC impedance and capacitance measurement methods. With increasing the cold rolling deformation ranging from 0% to 60%, the passive region of high nitrogen austenitic stainless steel decreases, and the corrosion potential, EIS radius and polarization resistance all decreases. The Mott-Schottky result indicates that the pitting corrosion resistance deteriorates with increment of cold rolling deformation. The results show that the passive films formed on high nitrogen austenitic stainless steel with different cold rolling deformation behave as n-type semiconductors. With increasing the cold rolling deformation grade, the donor density (ND) increases, but the thickness of the space-charge layer (W) decreases. The decreasing of the thickness of space-charge layer with increment of cold rolling deformation is attributed to the inceasing defect which deteriorates the stability of the passive film.

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