The X-Ray Diffraction Measurement of Residual Stresses in Aluminum Alloys

1963 ◽  
Vol 7 ◽  
pp. 31-45 ◽  
Author(s):  
Ronald C. Larson
Keyword(s):  
Residual Stress ◽  
Aluminum Alloys ◽  
Residual Stresses ◽  
Stress Gradient ◽  
Stress System ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Radiation Beam ◽  
X Ray ◽  
Operational Variables

AbstractThis paper presents the theoretical and practical aspects of measuring residual stresses by X-ray diffraction with emphasis on the analysis of aluminum alloys. The theoretical considerations of radiation) beam geometry, and peak location will be discussed in regard to establishing optimum analysis techniques. The precision and reproducibility of this technique have been investigated so that results can be applied accurately. The approach, however, is basically a practical one, with the intent of studying residual stress systems as they affect engineering applications. Residual stress systems produced by thermal and mechanical treatments have been determined and the effect of treatment modifications and variations on the resultant stress system have been analyzed. The effect of operational variables such as time and temperature on the developed stress system are shown. From this, the merits of a particular treatment can be determined with respect to its intended application.Analysis of solution heat-treated and quenched 2014 aluminum has shown a significant effect of the quench temperature on the resultant residual stress system. The results obtained from shot-peening this alloy are presented, as well as the effect of time and temperature on the shot-peened stress gradient.

Non-Destructive Residual Stress Analysis of Induction Hardened Components by Neutron and X-Ray Diffraction

2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch
Keyword(s):  
Residual Stress ◽  
Chemical Composition ◽  
Residual Stresses ◽  
Stress Analysis ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Neutron Measurement ◽  
X Ray ◽  
Layer Removal ◽  
Residual Stress Analysis

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.

scholarly journals Material Removal, Correction and Laboratory X-Ray Diffraction

2014 ◽  
Vol 996 ◽  
pp. 181-186 ◽  
Author(s):  
Eric Wasniewski ◽  
Baptiste Honnart ◽  
Fabien Lefebvre ◽  
Eric Usmial
Keyword(s):  
Residual Stress ◽  
Stress Relaxation ◽  
Stress Field ◽  
Residual Stresses ◽  
Material Removal ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Residual Stresses ◽  
Residual Stress Gradient

Laboratory X-ray diffraction is commonly used for surface residual stresses determination. Nevertheless, the in-depth residual stress gradient also needs to be known. Chemical or electro-polishing method is generally used for material removal. However, material removal may seek a new equilibrium and stress field may change in such a way that experimental residual stress values must be corrected. Different methods exist to account for the residual stress relaxation associated with the material removal operation and will be discussed in this paper.

Residual Stress Measurements on IN718 Fatigue Specimens Using X-Ray Diffraction Techniques

2016 ◽  
Vol 879 ◽  
pp. 578-582
Author(s):  
Yi Fei Gao ◽  
Shu Lan Wang
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Measurement ◽  
Low Cycle Fatigue ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Special Requirement ◽  
X Ray ◽  
Stress Measurements ◽  
Surface Residual Stresses

Residual stress measurements were successfully performed on the representative IN718 fatigue specimens by X-Ray Diffraction. All surface residual stresses were found to be compressive. A stress gradient normal to the surface was observed on all specimens. The residual stresses tended to become less compressive with increasing depth into the parts. Residual stress measurement is the special requirement for NADCAP CRITERIA AC 7101/7. In this paper, residual stress measurements were successfully performed on two IN718 low cycle fatigue test specimens.

Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients

2007 ◽  
Vol 40 (4) ◽  
pp. 675-683 ◽  
Author(s):  
Cristy L. Azanza Ricardo ◽  
Mirco D'Incau ◽  
Paolo Scardi
Keyword(s):  
Residual Stress ◽  
Hole Drilling ◽  
Al Alloy ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Surface Residual Stress ◽  
X Ray ◽  
Stress Gradients ◽  
Layer Removal ◽  
Removal Technique

A new procedure is proposed to determine sub-surface residual stress gradients by laboratory X-ray diffraction measurements at different depths using a chemical layer-removal technique. The standard correction algorithm for stress relaxation due to layer removal is improved by including corrections for X-ray absorption, and by the addition of constraints imposed by the mechanical equilibrium conditions. Besides correcting the data,i.e.providing more reliable through-thickness residual stress trends, the proposed procedure also provides an elastically compatible and plausible estimate of the residual stress inside the component, well beyond the measured region. The application of the model is illustrated for a set of Al-alloy components shot-peened at different Almen intensities. Results are compared with those given by `blind hole drilling', which is an independent and partly destructive method.

Computer Controlled X-Ray Diffraction Measurement of Residual Stress

1972 ◽  
Vol 16 ◽  
pp. 344-353 ◽  
Author(s):  
Carol J. Kelly ◽  
E. Eichen
Keyword(s):  
Residual Stress ◽  
Computer Control ◽  
Sample Surface ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Intensity Measurements ◽  
On Line ◽  
Computer Controlled ◽  
The Difference

AbstractThe system to be described includes hardware and software for the on-line computer control of the X-ray diffraction measurement of residual stress. This determination involves accurately measuring the angles at which a back-reflection line is diffracted, first by diffracting planes parallel to the sample surface, and then by planes at an angle (ψ) to the sample surface. The residual stress is calculated from the difference in the two measured diffraetion angles. The procedure executed by the computer consists of locating the peaks, selecting three angles for collection of X-ray counts, correcting the measured counts, fitting the equi-angular intensity measurements to a three-point parabola, calculating the peak angles, calculating the residual stress from the measured angles and typing a report. This automation has eliminated the tedium of the manual X-ray data accumulation and of the residual stress calculation. The online control has also permitted improvements in the technique not practicable with the manually performed measurement of residual stress.

X-Ray Diffraction Measurement of Residual Stresses in Thick, Multi-Pass Steel Weldments

1985 ◽  
Vol 107 (2) ◽  
pp. 185-191 ◽  
Author(s):  
C. O. Ruud ◽  
R. N. Pangborn ◽  
P. S. DiMascio ◽  
D. J. Snoha
Keyword(s):  
Residual Stress ◽  
Measurement Accuracy ◽  
Stress Measurement ◽  
Three Dimensional ◽  
Residual Stress Measurement ◽  
Stress Fields ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Removal Technique

A unique X-ray diffraction instrument for residual stress measurement has been developed that provides for speed, ease of measurement, accuracy, and economy of surface stress measurement. Application of this instrument with a material removal technique, e.g., electropolishing, has facilitated detailed, high resolution studies of three-dimensional stress fields. This paper describes the instrumentation and techniques applied to conduct the residual stress measurement and presents maps of the residual stress data obtained for the surfaces of a heavy 2 1/4 Cr 1 Mo steel plate weldment.

Sign in / Sign up

Export Citation Format

Share Document