scholarly journals Material Removal, Correction and Laboratory X-Ray Diffraction

2014 ◽  
Vol 996 ◽  
pp. 181-186 ◽  
Author(s):  
Eric Wasniewski ◽  
Baptiste Honnart ◽  
Fabien Lefebvre ◽  
Eric Usmial
Keyword(s):  
Residual Stress ◽  
Stress Relaxation ◽  
Stress Field ◽  
Residual Stresses ◽  
Material Removal ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Residual Stresses ◽  
Residual Stress Gradient

Laboratory X-ray diffraction is commonly used for surface residual stresses determination. Nevertheless, the in-depth residual stress gradient also needs to be known. Chemical or electro-polishing method is generally used for material removal. However, material removal may seek a new equilibrium and stress field may change in such a way that experimental residual stress values must be corrected. Different methods exist to account for the residual stress relaxation associated with the material removal operation and will be discussed in this paper.

Residual Stress Measurements on IN718 Fatigue Specimens Using X-Ray Diffraction Techniques

2016 ◽  
Vol 879 ◽  
pp. 578-582
Author(s):  
Yi Fei Gao ◽  
Shu Lan Wang
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Measurement ◽  
Low Cycle Fatigue ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Special Requirement ◽  
X Ray ◽  
Stress Measurements ◽  
Surface Residual Stresses

Residual stress measurements were successfully performed on the representative IN718 fatigue specimens by X-Ray Diffraction. All surface residual stresses were found to be compressive. A stress gradient normal to the surface was observed on all specimens. The residual stresses tended to become less compressive with increasing depth into the parts. Residual stress measurement is the special requirement for NADCAP CRITERIA AC 7101/7. In this paper, residual stress measurements were successfully performed on two IN718 low cycle fatigue test specimens.

Non-Destructive Residual Stress Analysis of Induction Hardened Components by Neutron and X-Ray Diffraction

2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch
Keyword(s):  
Residual Stress ◽  
Chemical Composition ◽  
Residual Stresses ◽  
Stress Analysis ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Neutron Measurement ◽  
X Ray ◽  
Layer Removal ◽  
Residual Stress Analysis

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.

Determination of Surface Residual Stresses in Machined Ceramics Using Indentation Fracture

1996 ◽  
Vol 118 (4) ◽  
pp. 483-489 ◽  
Author(s):  
Y. Ahn ◽  
S. Chandrasekar ◽  
T. N. Farris
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Soda Lime Glass ◽  
X Ray Diffraction ◽  
Reliable Technique ◽  
X Ray ◽  
Indentation Technique ◽  
Vickers Indenter ◽  
Surface Residual Stresses ◽  
Zn Ferrite

Machining produces surface residual stresses which significantly influence the strength and wear resistance of ceramic components. As new methods are developed for machining ceramics, a quick and reliable technique for measurement of residual stresses would be valuable in assessing the viability of these methods from a residual stress perspective. The residual stresses on ground and polished (i.e. machined) surfaces of soda-lime glass, Ni-Zn ferrite, and silicon nitride have been measured using an indentation technique with a Vickers indenter. In this technique, the surface extent of the median/radial cracks produced by the Vickers indenter in machined and in annealed ceramics are measured. These are then combined with a fracture mechanics analysis to estimate the surface residual stresses produced by machining. In order to determine the validity of the indentation technique for estimating machining residual stresses, these stresses were also measured using an X-ray diffraction and a deflection method. The residual stress values determined using the indentation technique in the machined ceramics were found to be reasonably close to those obtained from the X-ray diffraction and deflection methods. Since the indentation technique is relatively simple and easily applied, it offers a promising method for evaluating surface residual stresses in machined ceramics.

Experimental Comparison of In-Depth Residual Stresses Measured with Neutron and X-Ray Diffraction with a Numerical Stress Relaxation Correction Method

2017 ◽  
Vol 905 ◽  
pp. 131-136
Author(s):  
Bruno Levieil ◽  
Florent Bridier ◽  
Cédric Doudard ◽  
Vincent Klosek ◽  
David Thévenet ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Relaxation ◽  
Neutron Diffraction ◽  
Residual Stresses ◽  
Correction Method ◽  
Experimental Comparison ◽  
X Ray Diffraction ◽  
Element Analysis ◽  
Notched Specimen ◽  
X Ray

This study is an experimental comparison of in-depth X-ray diffraction residual stress measurements with neutron diffraction measurements. The goal is to evaluate the relevance of the Savaria-Bridier-Bocher [1] stress relaxation correction method. Neutron diffraction are performed on a bent notched specimen. Destructive X-ray diffraction is performed until 5.25mm below the surface by polishing the material. This polishing induces stress relaxation and X-ray diffraction results have to be corrected. For that purpose, a finite element analysis is realised and show good correlation with neutron measurements results. The application of the stress correction method improves the X-ray measurements especially after 2 mm below the surface. The differences between measured and corrected residual stresses from both diffraction techniques are analyzed and discussed.

Analysis of Residual Stress Gradients Below the Surface of a Material Using a Multi-Energy Method

2001 ◽  
Vol 678 ◽  
Author(s):  
Yanan Xiao ◽  
Tim Graber ◽  
Myungae Lee ◽  
Dale E. Wittmer ◽  
Susan M. Mini
Keyword(s):  
Residual Stress ◽  
Stress Gradient ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Gradient Distribution ◽  
X Ray ◽  
Experimental Parameters ◽  
The Relationship ◽  
X Ray Absorption ◽  
Residual Stress Gradient

AbstractThe residual-stress-gradient distribution just below the surface of a material is an important factor to consider during the engineering and design of a component. With the availability of an intense energy-tunable synchrotron x-ray source, it becomes easier to analyze the stress gradient below the surface, using a multi-energy x-ray diffraction method. A program was developed to efficiently determine possible experimental parameters using a sample with a known stress gradient distribution. In addition, this program can also calculate the stress gradient distribution below the surface taking into account experimental results. It also includes a subroutine for calculating the x-ray absorption coefficients of all of the elements, generalizing it for use with any material. As an example, in the present study, the relationship between x-ray energy and the residual stress gradient is discussed according to the calculated result for a silicon nitride composition.

The X-Ray Diffraction Measurement of Residual Stresses in Aluminum Alloys

1963 ◽  
Vol 7 ◽  
pp. 31-45 ◽  
Author(s):  
Ronald C. Larson
Keyword(s):  
Residual Stress ◽  
Aluminum Alloys ◽  
Residual Stresses ◽  
Stress Gradient ◽  
Stress System ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Radiation Beam ◽  
X Ray ◽  
Operational Variables

AbstractThis paper presents the theoretical and practical aspects of measuring residual stresses by X-ray diffraction with emphasis on the analysis of aluminum alloys. The theoretical considerations of radiation) beam geometry, and peak location will be discussed in regard to establishing optimum analysis techniques. The precision and reproducibility of this technique have been investigated so that results can be applied accurately. The approach, however, is basically a practical one, with the intent of studying residual stress systems as they affect engineering applications. Residual stress systems produced by thermal and mechanical treatments have been determined and the effect of treatment modifications and variations on the resultant stress system have been analyzed. The effect of operational variables such as time and temperature on the developed stress system are shown. From this, the merits of a particular treatment can be determined with respect to its intended application.Analysis of solution heat-treated and quenched 2014 aluminum has shown a significant effect of the quench temperature on the resultant residual stress system. The results obtained from shot-peening this alloy are presented, as well as the effect of time and temperature on the shot-peened stress gradient.

scholarly journals Influence of Surface Roughness on Evaluation of Stress Gradients in Coatings

2011 ◽  
Vol 681 ◽  
pp. 121-126 ◽  
Author(s):  
Andrey Benediktovich ◽  
Hugues Guerault ◽  
Ilya Feranchuk ◽  
V. Uglov ◽  
Alex Ulyanenkov
Keyword(s):  
Residual Stress ◽  
Surface Roughness ◽  
Depth Profile ◽  
Stress Gradient ◽  
Grazing Incidence ◽  
Refraction Index ◽  
X Ray Diffraction ◽  
Wave Fields ◽  
X Ray ◽  
Residual Stress Gradient

Roughness influence on the residual stress gradient evaluation in the case of a grazing incidence X-ray diffraction setup is considered. In this geometry the surface roughness changes essentially the X-ray wave fields of the transmitted and diffracted beams inside the coatings and subsurface regions of bulk samples, and thus influences the refractive properties of the investigated sample area. In turn, the change in the refraction index enforces the re-scale of the informational depth and, consequently, the evaluated stress depth profile. The diffracted amplitude from the crystalline grain located beneath the surface is calculated. The surface roughness is shown to contribute into reconstruction of the real stress gradient profile of the coating.

Micro-slotting technique for reliable measurement of sub-surface residual stress in Ti-6Al-4V

2018 ◽  
Vol 53 (6) ◽  
pp. 389-399 ◽  
Author(s):  
Elizabeth Burns ◽  
Joseph Newkirk ◽  
James Castle
Keyword(s):  
Residual Stress ◽  
Finite Element ◽  
Residual Stresses ◽  
Image Correlation ◽  
X Ray Diffraction ◽  
Surface Residual Stress ◽  
Near Surface ◽  
X Ray ◽  
Measurement Volume ◽  
Surface Residual Stresses

Micro-slotting, a relaxation residual stress measurement technique, has recently been shown to be an effective method for measuring local residual stresses in a variety of materials. The micro-slotting method relies on a scanning electron microscope–focused ion beam system for milling and imaging, digital image correlation software to track displacements due to residual stress relaxation after milling, and finite element analysis for displacement–stress correlation and calculation of the original stress state in the imaged region. The high spatial resolution of the micro-slotting method makes it a promising technique for obtaining near-surface residual stress data in Ti-6Al-4V components for input into fatigue life models and crack growth simulations. However, use of the micro-slotting method on this alloy has yet to be evaluated against more established measurement techniques. In this study, spatially resolved sub-surface residual stress measurements were obtained on shot peened and low-stress surface-machined Ti-6Al-4V planar coupons using the micro-slotting method and were compared to measurements obtained using the conventional X-ray diffraction depth profiling technique. The sub-surface measurements were in good agreement for the shot peened sample. Observed differences in the measured near-surface residual stresses on the surface-machined sample were attributed to the larger measurement volume of the X-ray diffraction method, suggesting that the micron-sized measurement volume of the micro-slotting method may be more suitable for capturing shallow stress profiles and steep stress gradients. Prior to performing the micro-slotting measurements, finite element modeled displacements were used to verify the measurement procedure and to address uncertainties in the milled slot geometries. The results of this study demonstrated the validity of the micro-slotting procedure and established the technique as a reliable method for measuring sub-surface residual stresses in Ti-6Al-4V.

Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods

2006 ◽  
Vol 524-525 ◽  
pp. 25-30 ◽  
Author(s):  
Cristy Leonor Azanza Ricardo ◽  
Mirco D'Incau ◽  
Paolo Scardi
Keyword(s):  
Residual Stress ◽  
Stress Gradient ◽  
Simple Algorithm ◽  
Typical Case ◽  
X Ray Diffraction ◽  
Metal Component ◽  
Surface Residual Stress ◽  
X Ray ◽  
X Ray Absorption ◽  
Residual Stress Gradient

A new algorithm is proposed to determine the through-thickness residual stress gradient by X-ray Diffraction measurements on progressively thinned components. The procedure is based on a chemical or electrochemical attack of the component surface, which is then measured at each thinning stage. The simple algorithm provided for by a specific norm has been revised to take into account the X-ray absorption effects and the conditions of mechanical equilibrium of the component. The new procedure is illustrated for a typical case of study concerning a shot-peened metal component.

Influence of deposition parameters on the residual stresses of WC-Wo sputtered thin films

MRS Advances ◽  
2020 ◽  
Vol 5 (23-24) ◽  
pp. 1215-1223
Author(s):  
R.R. Phiri ◽  
O.P. Oladijo ◽  
E.T. Akinlabi
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Residual Stresses ◽  
Substrate Surface ◽  
Tribological Performance ◽  
X Ray Diffraction ◽  
X Ray ◽  
Compressive Stresses ◽  
Deposition Parameters ◽  
Cobalt Thin Films

AbstractControl and manipulation of residual stresses in thin films is a key for attaining coatings with high mechanical and tribological performance. It is therefore imperative to have reliable residual stress measurements methods to further understand the dynamics involved. The sin2ψ method of X-ray diffraction was used to investigate the residual stresses on the tungsten carbide cobalt thin films deposited on a mild steel surface to understand the how the deposition parameters influence the generation of residual stresses within the substrate surface. X-ray spectra of the surface revealed an amorphous phase of the thin film therefore the stress measured was of the substrate surface and the effects of sputtering parameters on residual stress were analysed. Compressive stresses were identified within all samples studied. The results reveal that as the sputtering parameters are varied, the residual stresses also change. Optimum deposition parameters in terms of residual stresses were suggested.

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