Measuring Residual and Applied Stress using X-Ray Diffraction on Materials with Preferred Orientation and Large Grain Size

1992 ◽  
Vol 36 ◽  
pp. 585-593
Author(s):  
James Pineault ◽  
Michael Brauss
Keyword(s):  
Grain Size ◽  
Stress Measurement ◽  
Preferred Orientation ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Common Solution ◽  
Virtual Window ◽  
The Common ◽  
Comparison Of The Results

AbstractOne of the most difficult tasks in applied and residual stress measurement of polycrystalline materials using x-ray diffraction is dealing with preferred orientation and large grain size.A common solution to large grain size problems has been to choose a larger aperture, but in certain cases this is undesirable and/or impossible. When preferred orientation has been identified as the problem, the common approach has been to choose another diffraction plane or oscillate the x-ray diffraction head during data collection. Remedies such as these can distort the peak breadth and are often not sufficient to totally negate the grain size and preferred orientation effects.A technique described as the “step scan with virtual window” has been developed jointly at MTL (formerly Canmet) and Proto Mfg. Ltd. to deal specifically with the aforementioned effects of grain size and preferred orientation.This paper highlights some of the problems that arise in stress analysis of materials exhibiting preferred orientation and large grain size. Subsequently a comparison of the results obtained using standard diffraction technique, oscillation and the “step scan with virtual window” is made.

Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method

1988 ◽  
Vol 32 ◽  
pp. 459-469 ◽  
Author(s):  
Masanori Kurita ◽  
Ikuo Ihara ◽  
Nobuyuki Ono
Keyword(s):  
Residual Stress ◽  
Single Crystal ◽  
Elastic Constants ◽  
Stress Measurement ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Small Areas ◽  
Curve Method ◽  
The Continuum

The residual stress induced by grinding or some thermal treatment has a large effect on the strength of ceramics. The X-ray technique can be used to nondestructively measure the residual stress in small areas on the surface of polycrystalline materials. The X-ray stress measurement is based on. the continuum mechanics for macroscopically isotropic polycrystalline materials. In this method, the stress value is calculated selectively from strains of a particular diffraction plane in the grains which are favorably oriented for the diffraction. In general, however, the elastic constants of a single crystal depend on the plane of the lattice, since a single crystal is anisotropic, The behavior of the deformation of individual crystals in the aggregate of polycrystalline materials under applied stress has not yet been solved successfully. Therefore, the stress constant and elastic constants for a particular diffracting plane should be determined experimentally in order to determine the residual stress accurately by X-ray diffraction.

An improved method for quantitative analysis of sedimentary minerals by X-ray diffraction

1996 ◽  
Vol 11 (3) ◽  
pp. 235-239 ◽  
Author(s):  
Wang Chao ◽  
Pan Chunde ◽  
Wang Daqing ◽  
Song Aixia ◽  
Nie Jihong ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Preferred Orientation ◽  
Improved Method ◽  
X Ray Diffraction ◽  
Absolute Deviation ◽  
X Ray ◽  
Sedimentary Environments ◽  
Loading Method ◽  
Intensity Ratios ◽  
Comparison Of The Results

An improved backloading method to determine the reference intensity ratios of sedimentary minerals is presented. More than 50 reference intensity ratios of more than ten types of minerals formed in typical sedimentary environments were measured. Quantitative tests were performed on those minerals. Comparison of the results show that this method minimizes preferred orientation and improves quantitative precision (absolute deviation is less than 3%) so that it is an acceptable specimen loading method.

New methods for diffraction stress measurement: a critical evaluation of new and existing methods

2000 ◽  
Vol 33 (4) ◽  
pp. 1059-1066 ◽  
Author(s):  
J.-D. Kamminga ◽  
Th. H. de Keijser ◽  
E. J. Mittemeijer ◽  
R. Delhez
Keyword(s):  
Stress Analysis ◽  
Elastic Constants ◽  
Stress Measurement ◽  
Critical Evaluation ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
New Methods

New methods of diffraction stress analysis of polycrystalline materials, consisting of cubic elastically anisotropic crystallites, are proposed and compared with existing methods. Whereas for the existing methods knowledge of the diffraction elastic constants is presupposed, three new methods are presented that require only knowledge of the (macroscopic) mechanical elastic constants. The stress values obtained with these new methods on the basis of the mechanical elastic constants are more reliable than those obtained with the methods on the basis of the diffraction elastic constants. New and existing methods are illustrated by means of measurements of X-ray diffraction from a magnetron-sputtered TiN layer.

Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics

1988 ◽  
Vol 32 ◽  
pp. 377-388 ◽  
Author(s):  
Masanori Kurita
Keyword(s):  
Elastic Constants ◽  
Stress Measurement ◽  
Steel Specimen ◽  
Polycrystalline Materials ◽  
X Rays ◽  
Confidence Limits ◽  
X Ray Diffraction ◽  
X Ray ◽  
Standard Deviations ◽  
Counting Statistics

AbstractX-ray diffraction can be used to nondestructively measure residual stress of polycrystalline materials. In x-ray stress measurement, it is important to determine a stress constant experimentally in order to measure the stress accurately. However, every value measured by x-ray diffraction has statistical errors arising from counting statistics. The equations for calculating the standard deviations of the stress constant and elastic constants measured by x-rays are derived analytically in order to ascertain the reproducibility of the measured values. These standard deviations represent the size of the variability caused by counting statistics, and can be calculated from a single set of measurements by using these equations. These equations can apply Lu any meuhud for x-ray stress ifiesuremenL. The variances of the x-ray stress and elastic constants are expressed in terms of the linear combinations of the variances of the peak position. The confidence limits of these constants of a quenched and tempered steel specimen were determined by the Gaussian curve method. The 95% confidence limits of the stress constant were -314 ± 25 MFa/deg.

A STUDY OF MICROCRYSTALLINITY OF Pd3Si DURING THE CRYSTALLIZATION OF AMORPHOUS Pd80Si20 BY X-RAY DIFFRACTION

1989 ◽  
Vol 03 (04) ◽  
pp. 313-318
Author(s):  
K.Q. XIAO ◽  
Y.D. DONG ◽  
Y.Z. HE
Keyword(s):  
Grain Size ◽  
Electrical Resistivity ◽  
Metallic Glass ◽  
Sharp Increase ◽  
Lattice Strain ◽  
Preferred Orientation ◽  
Strain Variation ◽  
X Ray Diffraction ◽  
X Ray

The origin of Pd 3 Si grain size and lattice strain variation during the crystallization of Pd 80 Si 20 metallic glass was discussed. A correlation between the preferred orientation of grains and the sharp increase of grain size was analyzed. Results also show that the change of electrical resistivity was very sensitive to that of the grain size.

Effects of La-Dopant on Phase, Microstructure and Dielectric Properties of Bi4Ti3O12 Ceramics

2010 ◽  
Vol 93-94 ◽  
pp. 251-254 ◽  
Author(s):  
Pasinee Siriprapa ◽  
Anucha Watcharapasorn ◽  
Sukanda Jiansirisomboon
Keyword(s):  
Dielectric Constant ◽  
Grain Size ◽  
Dielectric Properties ◽  
Solid State ◽  
Diffraction Analysis ◽  
Solid State Reaction ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
Conventional Solid State Reaction ◽  
X Ray

Bi4-xLaxTi3O12 (where x = 0, 0.25, 0.50, 0.75 and 1) powders and ceramics were prepared using conventional solid state reaction and sintering procedures. The calcination was carried out at 750 °C for 4 h and sintering was done at 1150 °C for 4 h. The density of all ceramics was found to be comparable regardless of La concentration. X-ray diffraction analysis showed that preferred orientation of ceramic grains was reduced with addition of La ions. This reduced preferred orientation was accompanied by a decrease in grain size. The temperature dependence of dielectric constant showed a decrease in Tc with increasing La concentration.

scholarly journals Statistical analysis of the reproducibility of residual stress measurements in cold extruded parts

2021 ◽  
Author(s):  
Fabian Jaeger ◽  
Alessandro Franceschi ◽  
Holger Hoche ◽  
Peter Groche ◽  
Matthias Oechsner
Keyword(s):  
Residual Stress ◽  
Statistical Analysis ◽  
Stress Measurement ◽  
Industrial Applications ◽  
Cold Extrusion ◽  
X Ray Diffraction ◽  
Forming Process ◽  
X Ray ◽  
Stress States ◽  
Key Aspects

AbstractCold extruded components are characterized by residual stresses, which originate from the experienced manufacturing process. For industrial applications, reproducibility and homogeneity of the final components are key aspects for an optimized quality control. Although striving to obtain identical deformation and surface conditions, fluctuation in the manufacturing parameters and contact shear conditions during the forming process may lead to variations of the spatial residual stress distribution in the final product. This could lead to a dependency of the residual stress measurement results on the relative axial and circumferential position on the sample. An attempt to examine this problem is made by the employment of design of experiments (DoE) methods. A statistical analysis of the residual stress results generated through X-Ray diffraction is performed. Additionally, the ability of cold extrusion processes to generate uniform stress states is analyzed on specimens of austenitic stainless steel 1.4404 and possible correlations with the pre-deformed condition are statistically examined. Moreover, the influence of the coating, consisting of oxalate and a MoS2 based lubricant, on the X-Ray diffraction measurements of the surface is investigated.

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